Specifications
SPECORD PLUS
40
Scattered light at 340 nm (NaNO
2
)
≤ 0.02 %T
Baseline noise at 500 nm (RMS)
≤ 0.0001 A
Baseline deviation (200 – 1000 nm)
± 0.0005 A
Long-term stability at 500 nm
± 0.0005 A/h
Uncorrected 100 % transmission line
(min./max.; 200 – 1000 nm)
300 to 900 %T
Logging speed
Up to 12000 nm/min
Minimum integration time
0.001 s
Minimum data interval
0.02 nm
* Taking into account the tolerances of the standard solutions used
** Merck® 1.08164.0001
10.1.3 SPECORD 200 PLUS
Optics
Double-beam spectrophotometer with fixed
slit
Wavelength range
190 to 1100 mm
Photometric display range
-9 to 9 A
Photometric measuring range
-3 to 3 A
Spectral bandwidth
1.4 nm
Spectral resolution capability for
toluol/hexane at 20 – 25 °C
1.6 to 1.8
Wavelength accuracy
(deuterium line at 486 nm)
± 0.2 nm
Wavelength accuracy
(deuterium line at 656.1 nm)
± 0.1 nm
Wavelength accuracy
(holmium oxide filter at 360.9 nm)*
± 0.5 nm
Wavelength reproducibility
(holmium oxide filter at 360.9 nm)*
≤ 0.02 nm
Transmission zero point
(200 – 1000 nm)
± 0.05 %T
VIS photometric accuracy
(Hellma neutral glass filter F4 at 546 nm)*
± 0.003 A
UV photometric accuracy
(potassium dichromate)*
± 0.010 A
Photometric accuracy
(potassium dichromate at 430 nm)*
± 0.010 A
Photometric reproducibility
(Hellma neutral glass filter F4 at 546 nm)*
≤ 0.0005 A
Scattered light at 198 nm (KCl)**
≤ 0.3 %T
Scattered light at 220 nm (Nal)
≤ 0.03 %T
Scattered light at 240 nm (Nal)
≤ 0.03 %T
Scattered light at 340 nm (NaNO
2
)
≤ 0.02 %T
Baseline noise at 500 nm (RMS)
≤ 0.0001 A
Baseline deviation (200 – 1000 nm)
± 0.0005 A
Long-term stability at 500 nm
± 0.0005 A/h
Uncorrected 100 % transmission line
(min./max.; 200 – 1000 nm)
60 to 160 %T
