CS5530
DS742F3
33
Measurement and Reference Inputs
AIN1+, AIN1- – Differential Analog Input
Differential input pins into the device.
VREF+, VREF- – Voltage Reference Input
Fully differential inputs which establish the voltage reference for the on-chip modulator.
C1, C2 – Amplifier Capacitor Inputs
Connections for the instrumentation amplifier’s capacitor.
Power Supply Connections
VA+ – Positive Analog Power
Positive analog supply voltage.
VD+ – Positive Digital Power
Positive digital supply voltage (nom3.0 V or +5 V).
VA- – Negative Analog Power
Negative analog supply voltage.
DGND – Digital Ground
Digital Ground.
4. SPECIFICATION DEFINITIONS
Linearity Error
The deviation of a code from a straight line which connects the two endpoints of the ADC
transfer function. One endpoint is located 1/2 LSB below the first code transition and the other
endpoint is located 1/2 LSB beyond the code transition to all ones. Units in percent of full-
scale.
Differential Nonlinearity
The deviation of a code's width from the ideal width. Units in LSBs.
Full-scale Error
The deviation of the last code transition from the ideal [{(VREF+) - (VREF-)} - 3/2 LSB]. Units
are in LSBs.
Unipolar Offset
The deviation of the first code transition from the ideal (1/2 LSB above the voltage on the AIN-
pin.). When in unipolar mode (U/B bit = 1). Units are in LSBs.
Bipolar Offset
The deviation of the mid-scale transition (111...111 to 000...000) from the ideal (1/2 LSB below
the voltage on the AIN- pin). When in bipolar mode (U/B bit = 0). Units are in LSBs.
