Alcatel-Lucent 1850 TSS-320, Turn-Up And Commissioning Manual, Page: 48 / 140

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Local testing and operating sequence Tests and Measurements
3-22
PN 8DG08136CAAA
Issue 1 March 2008
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Figure 3-5 Test of GbE transport on VC3-xV
Refer to Table 3-1, “Instruments” (p. 3-2) for the SFP list and Chapter 4 , “SFP and XFP
modules optical characteristics” (p. 4-16) for the technical specifications.
CT Procedure
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1
Cross-connect the GbE port (on PIM1GE) to the SONET port via the multiservice PIM
(PIMMS) and the Matrix (MT320)
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2
By CT create a number of active VC4-xV (x = 7) on PIMMS, as shown in Chapter 4 ,
“Unprotected, bi-directional cross-connect: concatenated group (VC4-7V) and STM-N
port” (p. 4-9)
.
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3
Cross-connect the VC4-7V to an SONET port (OC-36), as shown in Chapter 4 ,
“Unprotected, bi-directional cross-connect: concatenated group (VC4-7V) and STM-N
port” (p. 4-9)
.
6 9
1
5
8
1
1 5
9
2 5
1 4
1 3
1
8
1
1 5
9 2 5
1 4
1 3
1
1 3
+ -
1 3
+ -
PSFA PSFB
AUX CHANNELS
STUPA STUPB
HOUSEKEEPING
SHELF ID
RL
RA
3 9
36 35 34 33 32 31 30 29 28 27 2 6 25 24 23 22 21
20
3 7
19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2
1
R
A T
A B
C
M
m
W
D B G
R
A T
A B
C
M
m
W
D B G
S
O
UR
CE
S
STA
TU
S
SO
U
R
C
ES
ST
A
T
US
R
DBG
1
2
1
2
L N K
A C T
M
F D X
C O L
L N K
A C T
M
F D X
C O L
L N K
A C T
D S
F D X
C O L
L N K
A C T
D S
F D X
C O L
R
DBG
1
2
1
2
L N K
A C T
M
F D X
C O L
L N K
A C T
M
F D X
C O L
L N K
A C T
D S
F D X
C O L
L N K
A C T
D S
F D X
C O L
E
L
Error Detector
Pattern Generator
I Q
or
A
K
6 1
7 2
3
8
9 4
1 0 5
BLOCK DIAGRAM
1850 TSS-320
Loop
GbE
port
Matrix
Pattern Generator
Error Detector
SONET
/ SDH
port
Multi-
service
PIM