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48
0004-000067
Process Variable
Type
Values
Description
setStatusTestEnable
getStatusTestEnable
mbboDirect
mbbiDirect
0000
16
to
FFFF
16
Test register bit enable mask
Bit 0 = baseboard register test failed
Bit 1 = n/a
Bit 2 = baseboard ROM test failed
Bit 3 = n/a
Bit 4 = reference oscillator test failed
Bit 5 = DRAM test failed
Bit 6 = flash memory test failed
Bit 7 = unused
Bit 8 = digitizer 1 test failed
Bit 9 = digitizer 2 test failed (ZT4xx2)
Bits 10-15 = unused
StatusTestCond mbbiDirect
0000
16
to
FFFF
16
Test condition
Bit 0 = baseboard register test failed
Bit 1 = n/a
Bit 2 = baseboard ROM test failed
Bit 3 = n/a
Bit 4 = reference oscillator test failed
Bit 5 = DRAM test failed
Bit 6 = flash memory test failed
Bit 7 = unused
Bit 8 = digitizer 1 test failed
Bit 9 = digitizer 2 test failed (ZT4xx2)
Bits 10-15 = unused
StatusOperation mbbiDirect
0000
16
to
FFFF
16
Operation status results:
1 = latched event
Bit 0 = calibrating
Bit 1 = settling
Bit 2 = ranging
Bit 3 = sweeping
Bit 4 = measuring
Bit 5 = waiting for trigger
Bit 6 = waiting for arm
Bit 7 = unused
Bit 8 = trigger event
Bit 9 = data capture event
Bit 10 = limit test event
Bit 11 = auto download event
Bits 12-15 = unused
Содержание ZT4611
Страница 59: ...0004 000067 59 ZTEC Instruments...