X-Rite BASF 12/6, Руководство пользователя

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Instrument Specifications
Measurement geometries
Spectral multi-angle measurement geometries according ASTM:
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r45as-15, r45as15, r45as25, r45as45, r45as75, r45as110
Image-based texture measurement geometries
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The camera placed at 15° to the nominal.
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Measurement geometries: r15as15, r15as-45, r15as45, 15as80 and semi-diffuse
Spectral analyzer technology
A spectral analyzer at 45° to the nominal is in place for above multi-angle measurement geometries.
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Holographic diffraction grating with 128-pixel diode array (i1 technology)
• Continuous spectral resolution of 10 nm
• Pick-up spot size ~9 x 12 mm
Camera technology
• CMOS RGB camera
• Field of view 9 x 12mm
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Computed standardized HDR images with calibrated resolution
• Pixel size 25 μm in object space
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Optical resolution 50 μm
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Color space XYZ
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Data format EXR
Directional illumination
Technology
• LED technology
• White high-power LED
Wavelength range
• Wavelength range of illumination: default 400nm-700nm
Spot size
• Illumination spot size 13 x 16mm
Spectral measurement performance
Short-term repeatability (MCDM)
• MCDM: Mean color difference to mean. 10 measurements every 10s
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MCDM <= 0.05 dE on BCRA white
At 23°+-1°C and 40-60% relative humidity
100% test on manufacturing line.
Inter-instrument performance MCDP, XCDP, XCDS
• MCDP: Mean color difference to the population
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XDCP: Max color difference to the population
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XCDS: Max color difference to standard. Standard is defined as the MA91 centroid population transferred to the
HEFI calibration line.