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Index
© National Instruments Corporation
Index-4
GPIB-VXI User Manual
EPROM test, 5-2
GPIB test, 5-2
Local Interrupt test, 5-2
overview,
5-1
RAM test, 5-2
self-test operation, 2-13
test structure, 5-1
VXI Configuration Register test, 5-2
DINF? command, 3-27 to 3-28
DIP Switch and Trigger test, 5-2
DLAD? command, 3-28
DMA test, 5-2
DNUM? command, 3-29
documentation
abbreviations used in the manual,
vi
related
documents,
vii
downloaded CIs, C-6
DPram? command, 3-7
DRES? command, 3-29
dual-ported memory size, setting
description of, 2-7
switch settings (table), 2-7
dynamic configuration commands and queries
overview,
3-18
DCBNOSend,
3-19
DCGrantDev,
3-19
DCSystem?,
3-19
dynamic configuration devices, 2-14
dynamic configuration operation, 488-VXI
description of, 2-15
GPIB secondary address assignment, 2-15 to 2-16
Dynamic reconfiguration queries
overview,
3-20
Broadcast?, 3-21 to 3-23
GrantDev?,
3-23
RelSrvnt?,
3-24
E
!!E command, D-6
ECIs, overview, C-6
EEPROM.
See
nonvolatile configuration mode.
EPROM test, 5-2
EPROMed CIs, overview, C-6
equipment, optional, 1-3
error codes, B-1 to B-3
error reporting, local command set, 3-4
*ESE command, 3-39
*ESE? query, 3-39
*ESR? query, 3-39