Model SMM 770 Scanning Magnetic Microscope System
TRISTAN TECHNOLOGIES --Page
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229 micron wire separation
1.00E-06 T
2.00E-06 T
3.00E-06 T
4.00E-06 T
5.00E-06 T
6.00E-06 T
7.00E-06 T
-0.2 mm
0 mm
0.2 mm
0.4 mm
0.6 mm
0.8 mm
1 mm
Scan Data
Theoretical
Window
SQUID
Figure 3-9:
Vertical Scan of parallel wires 0.009" apart
76 micron wire separation
5.00E-07 T
1.00E-06 T
1.50E-06 T
2.00E-06 T
2.50E-06 T
0 mm
0 mm 0.1 mm 0.2 mm 0.3 mm 0.4 mm 0.5 mm 0.6 mm 0.7 mm 0.8 mm 0.9 mm
Scan Data
Theoretical
Window
SQUID
Figure 3-10: Vertical scan of parallel wires 0.003" apart
3.4.2 Spatial resolution
Resolution is defined as the smallest detectable change in position of a single magnetic
source. This can be calculated by comparison of the maximum observed spatial magnetic
field gradient to the system noise level across the measurement bandwidth of interest.
However, this is more easily understood visually by illustrating the accuracy at which the
center of a single magnetic source can be located.
Figure 3-11
shows the peak region of a
horizontal scan across parallel wires spaced 76 microns apart. Each data point is spaced 50
