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DLD8080 R4.30 & R4.31 Manual
2.3 General Overview of the System
The Surface Concept Delayline Detectors are particularly developed for the needs of 1D(x), 2D(x,t), 2D(x,y)
or 3D(x,y,t) area and time detection of electrons, ions, x-ray and UV-light.
The DLD8080 R4.30 & R4.31 are mounted on a CF160 vacuum flange with feedthroughs for high voltage
supply and signal transfer. They consist of a microchannel plate stack and two layers (x, y) of meander
structured delaylines. The image is sampled by the DLD readout electronics.
The 3D (x, y, t) detection bases on the measurement of time differences and time sums of signals, with a
high temporal resolution in one device. The count rate can reach several MHz in the commonly used 4-fold
coincidence measurement.
Typical applications are:
• imaging of parallel incident particle beams, particularly electrons
• spatially resolved time of flight spectroscopy in 2D/time resolved mode
• time referenced imaging of electrons excited by repetitive driven sources
and in energy analyzers:
• Fermi surface mapping, band mapping, photoelectron diffraction measurements, and similar angular
dispersion experiments in 2D mode
• XPS, UPS, ESCA and AES in virtual channel mode
• Stroboscopic experiments in 2D/time resolved mode
DLD8080 R4.30 & R4.31 Manual | Surface Concept GmbH