25
MDS-SE9
5. Key Test Mode
Procedure:
1.
Press the
?
/
1
button to turn on the power.(HCD-SE9)
2.
Press three bottons
Z
TAPE
,
TAPE
X
and
TAPE
x
simultaneously, and be in the state of version test mode.
Press
[TAPE DIRECTION]
button to select the key test mode.
3.
In the key test mode, the LCD displays “KEY 1”. Each time a button is pressed, “KEY #” value increases. However, once a button is
pressed, it is no longer taken into account. It is end at “KEY 19 OK”.
4.
To exit from this mode, press the
?
/
1
button. (HCD-SE9)
5. Selecting the Test Mode
There are 26 types of test modes as shown below. The groups can be switched by pressing the
MD
.
or
MD
>
button. After selecting
the group to be used, press the
[ENTER/START]
button. After setting a certain group, pressing the
MD
.
or
MD
>
button switches
modes shown below.
Refer to “Group” in the table for details can be selected.
All items used for servicing can be treated using group [Service]. So be carefully not to enter other groups by mistake.
Note:
Do not use the test mode in the [Develop] group.
If used, the unit may not operate normally.
If the [Develop] group is set accidentally, press the
[MODE]
button immediately to exit the [Develop] group.
MD TEST MODE
1. Precautions For Use of Test Mode
• As operations related to loading will be performed regardless of the test mode operations being performed, be sure to check that the disc
is stopped before setting and removing it.
Even if the
Z
MD
button is pressed while the disc is rotating during continuous playback, continuous recording, etc., the disc will not
stop rotating.
Therefore, it will be ejected while rotating.
Be sure to press the
Z
MD
button after pressing the
[MODE]
button and the rotation of disc is stopped.
1-1. Recording Laser Emission Mode and Operating Buttons
• Continuous recording mode (CREC 2MODE) (C37)
• Laser power check mode (LDPWR CHECK) (C13)
• Laser power adjustment mode (LDPWR ADJUST) (C04)
• Comparison with initial Iop value written in nonvolatile memory (Iop Compare) (C27)
• Write current Iop value in read nonvolatile memory using microprocessor (Iop NV Save) (C06)
• Traverse (MO) check (EF MO CHECK) (C14)
• Traverse (MO) adjustment (EF MO ADJUST) (C07)
• When pressing the
[REC/REC IT]
button.
2. Setting the Test Mode
Procedure : 1. Press the
?
/
1
button to turn the power on. (HCD-SE9)
2. Press the
[FUNCTION]
button to enter “MD” mode. (HCD-SE9)
3. Press three buttons of
MD
x
,
[REC MODE]
and
Z
MD
simultaneously.
When the test mode is set, “[Check]” will be displayed. Pressing the
MD
.
or
MD
>
button between the
following three groups; ···
Tt
[Check]
Tt
[Service]
Tt
[Develop]
Tt
···.
Note:
Do not use the test mode in the [Develop] group.
If used, the unit may not operate normally.
If the [Develop] group is set accidentally, press the
[MODE]
button immediately to exit the [Develop] group.
3. Releasing the Test Mode
Press the
Z
TAPE
button once and press the
?
/
1
button to turn the power off, the set goes to the standby mode.
4. Basic Operations of the Test Mode
All operations are performed using the
MD
.
,
MD
>
,
[ENTER/START]
,
[MODE]
and
[TAPE REC]
buttons.
The functions of these buttons are as follows.
Function name
Function
[ENTER/START]
button
Proceeds onto the next step. Finalizes input
[MODE]
button
Returns to previous step. Stops operations
MD
.
,
MD
>
buttons
Changes parameters and modes
[TAPE REC]
button
Selects the sub menu