TJA1055
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© NXP B.V. 2013. All rights reserved.
Product data sheet
Rev. 5 — 6 December 2013
15 of 26
NXP Semiconductors
TJA1055
Enhanced fault-tolerant CAN transceiver
[1]
All parameters are guaranteed over the virtual junction temperature range by design, but only 100 % tested at T
amb
= 125
C for dies on
wafer level, and above this for cased products 100 % tested at T
amb
= 25
C, unless otherwise specified.
[2]
To guarantee a successful mode transition under all conditions, the maximum specified time must be applied.
t
dom(CANH)
dominant time on pin CANH
low power modes; V
BAT
= 14 V
7
-
38
s
t
dom(CANL)
dominant time on pin CANL
low power modes; V
BAT
= 14 V
7
-
38
s
t
WAKE
local wake-up time on pin WAKE
low power modes; V
BAT
= 14 V; for wake-up
after receiving a falling or rising edge
7
-
38
s
t
det
failure detection time
normal operating mode
failures 3 and 3a
1.6
-
8.0
ms
failures 4, 6 and 7
0.3
-
1.6
ms
low power modes; V
BAT
= 14 V
failures 3 and 3a
1.6
-
8.0
ms
failures 4 and 7
0.1
-
1.6
ms
t
rec
failure recovery time
normal operating mode
failures 3 and 3a
0.3
-
1.6
ms
failures 4 and 7
7
-
38
s
failure 6
125
-
750
s
low power modes; V
BAT
= 14 V
failures 3, 3a, 4 and 7
0.3
-
1.6
ms
n
det
pulse-count failure detection
difference between CANH and CANL;
normal operating mode and failures 1, 2, 5
and 6a; pin ERR becomes LOW
-
4
-
n
rec
number of consecutive pulses for
failure recovery
on CANH and CANL simultaneously;
failures 1, 2, 5 and 6a
-
4
-
Table 9.
Dynamic characteristics
…continued
V
CC
= 4.75 V to 5.25 V; V
BAT
= 5.0 V to 40 V; V
STB
= V
CC
; T
vj
=
40
C to +150
C;
R
CAN_L
= R
CAN_H
= 125
; C
CAN_L
=
C
CAN_H
= 1 nF
; all voltages are defined with respect to ground; unless otherwise specified.
[1]
Symbol
Parameter
Conditions
Min
Typ
Max Unit
