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4/2022
NXP Semiconductors
UM11401
FRDMGD31RPEVM half-bridge evaluation board
Figure 31. Status tab
Pulse tab
•
Used for double pulse, short circuit, and PWM testing
•
Select desired T1, T2, and T3 timings for each test type; select enable then generate
pulses
Figure 32. Pulse tab
6.4 Troubleshooting
Some common issues and troubleshooting procedures are detailed below. This is not an
exhaustive list by any means, and additional debug may be needed:
UM11401
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© NXP B.V. 2021. All rights reserved.
User guide
Rev. 2 — 22 January 2021
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