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Test Setups
MC92602 Reduced Interface SerDes Design Verification Board User’s Guide, Rev. 3
4-4
Freescale Semiconductor
4.2.2
Reference Clock Jitter Transfer Test
This test setup is used to observe the amount of jitter placed on the reference clock that is transferred to
the data outputs. Example frequencies were chosen to match narrow bandpass filters available with the
Agilent 71500C jitter analysis system. The control bits are set as follows:
•
TBIE = ‘1’
All other control inputs are set to ‘0.’
The parallel data inputs must be set to the pattern shown in
Figure 4-4
. This data pattern appears as a
625-MHz clock signal at the serial outputs.
Figure 4-4. Reference Clock Jitter Transfer Test Setup
70000 Mainframe
with Microwave
Transition Analyzer
Ch1
Ch2
Function
Generator
Modul
ation Sign
al
10-MHz Ref
e
rence
Cloc
k
HPIB
Power
Splitter
Jittered
Clock
1.25 GHz
Prescaler
Divide-by-10
MC92602DVB
Serial Data
Jittered
Reference
Clock
125 MHz
Filter
Filter
Data
Synthesized
Sweeper
(Carrier Frequency)
DC Blocker
10101
Prescaler
Divide-by-2
DC Blocker
625 MHz
01010
10101
01010
10101
—
—
—
Parallel
CLK
1
0
1
0
1
—
—
—
Содержание MC92602
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