
According to
, the parameters of Decimation, Order and Cutoff, S_XIN, S_XCH,
and (Vp -Vm) affect the final accumulated scan result and the total scan time.
Users must adjust the touch electrode according to different applications. The parameters of TSI can be adjusted comprehensively
to achieve the best performance of TSI.
For example,
• Increase the voltage of (Vp-Vm) can reduce the effect of low frequency noise, but the scan time of TSI increases.
The increase of S_XCH and S_XIN can increase the charging current of C
i
and shorten the scan time of TSI, but the
noise increases. Therefore, when (Vp-Vm) increases, S_XCH and S_XIN can be reduced, which cannot only reduce the
scanning time but also reduce the noise and enhance the sensitivity.
• Decimation, Order, and Cutoff increase the number of scans for the touch electrodes and enhance the anti-interference
of the electrodes. At the same time, the scan time of the touch electrodes is also longer. Setting the Order as 2 is
recommended as it can save scan time to achieve the same digital scan result.
2.5 Scan time and sensitivity boost tests in self-cap mode
2.5.1 Scan time test in self-cap mode
This chapter shows the one self-cap touch electrode scan time test results on X-KE17Z-TSI-EVB.
As shown in
, given the NSTEP is 110 and Tnstep is 239 us by the measurement result of single scan, shown as
. The theoretical value can be calculated by
.
Table 8. Scan time test by changing the configuration of Decimation, Order, Cutoff
Switching
Clock (MHz)
NSTEP
Tnstep
(μs)
Configurations
Result
Decimation
Order
Cutoff
NSTEP
Multiple
Counter
Real
Scan
Round
Scan
Time
(μs)
1
0.52
1
1
1
1
110
1
239
2
0.52
110
239
2
1
1
2
220
2
448
3
0.52
110
239
4
1
1
4
440
4
869
4
0.52
110
239
8
1
1
8
880
8
1709
5
0.52
110
239
16
1
1
16
1760
16
3390
6
0.52
110
239
32
1
1
32
3520
32
6750
7
0.52
110
239
1
2
1
1
110
2
449
8
0.52
110
239
2
2
1
4
440
4
869
9
0.52
110
239
4
2
1
16
1760
8
1709
10
0.52
110
239
8
2
1
64
7040
16
3390
11
0.52
110
239
8
2
2
32
3520
16
3390
1. The Counter (TSICNT) is read from the register when debugging the code.
2. The actual Scan time is calculated by LPTMR module.
NXP Semiconductors
TSI self-cap mode introduction
KE17Z Dual TSI User Guide, Rev. 0, 05 May 2022
User Guide
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