Nokia RM-57, Руководство по обслуживанию

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Nokia Customer Care Appendix A: RF Troubleshooting
Company Confidential
Copyright © 2005 Nokia. All rights reserved
A-17
2.7 RX IQ loop back self test (ST_CDSP_RX_IQ_LOOP_BACK_TEST)
RX_IQ_LOOPBACK (81) tests that the RXI lines & VREFCM line between RAP & HINKU are connected.
Tested signals: VBAT_ASIC, RXQP, RXQN, RXIP, RXIN, VREFCM, TXIP, TXIN, RFBUS
Error code for this self test is given in format:
• 0xyy, 0xzz, MeasResult1, MeasResult2
,where 0xyy, 0xzz part is the main part of the error code: 0xyyzz
Measured IQ power
under limit
(0x0010)
ST_CDSP_RX_IQ_LOOP_BACK_TEST
Propablecause:
Poor solder/Faulty Hinku
Other possible reasons:
Vinku, but it should have
failed already in earlier
YES
NO
Any other code
YES
It’s not possibleto
get here…
NO
Propable cause:
Test problem
RFBUS failure (but this should
be ok if we’ve gotten this
Are RXIQ signals OK?
YES
NO
VREFCM OK?
YES
NO
Propablecause:
Poor solder/Faulty Hinku
Other possible reasons:
Retu/VB_ext line, but these should
have failed already
in earlier tests
Propable cause:
Poor solder/Faulty RAP
ST_CDSP_RX_IQ_LOOP_BACK_TEST
YES
NO
Any other code
YES
NO
YES
NO
VREFCM OK?
YES
NO
Measured IQ power
under limit
(0x0010)
It’s not possible to get
here…
A IQ signals OK?
Propable cause:
Poor solder/Faulty Hinku
Other possible reasons:
re RX
Vinku, but it should have
failed already in earlier
tests
Propable cause:
Test problem
RFBUS failure (but this
should be ok if we’ve
gotten this far)
Propable cause:
Poor solder/Faulty RAP
Propable cause:
Poor solder/Faulty Hinku
Other possible reasons:
Retu/VB_ext line, but these
should have failed already in
earlier tests.