Murata GRM0335C1HR50WD01 Series, Справочный лист

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No. Item
Specification
Test Method
Temperature
Compensating Type
High Dielectric Type
15 Temperature Cycle The measured and observed characteristics should satisfy the specifications in
the following table Fix the capacitor to the supporting jig in the same manner and
under the same conditions as (10). Perform the five cycles
according to the four heat treatments shown in the following
table. Set for 24
±
2 hours at room temperature, then measure
∙ Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10

C for one hour and
then set at room temperature for 24
±
2 hours. Perform the initial
measurement
Appearance No defects or abnormalities
Capacitance
Change Within
±
2.5% or
±
0.25pF
(Whichever is larger)
R6,R7,C8,L8,R9:Within
±
7.5%
E4,F5:Within
±
20%
Q/D.F. 30pF and over :
Q
≧
1000
30pF and below:
Q
≧
400+20C
C:Nominal
Capacitance (pF)
[R6,R7,C8,L8]
W.V.:100V : 0.025max. (C < 0. 068

F)
: 0.05max.(C
≧
0.068

F)
W.V.:25/50V :0.025max.
W.V.:16/10V :0.035max.
W.V.:6.3V/4V :0.05max. (C < 3.3

F)
:0.1max. (C
≧
3.3

F)
[R9]W.V.:50V: 0.05max.
[E4] W.V.:25Vmin. :0.025max
[F5] W.V.:25Vmin.
:0.05max. (C

0.1

F) :0.09max.(C
≧
0.1

F)
W.V.:16/10V:0.125max. W.V.:6.3V:0.15max.
I.R. More than 10,000M

or 500


F (Whichever is smaller)
Dielectric
Strength No defects
16 Humidity
Steady State The measured and observed characteristics should satisfy the specifications in
the following table Set the capacitor at 40
±
2

C and in 90 to 95% humiduty for
500
±
12 hours.
Remove and set for 24
±
2 hours at room temperature, then
measure.
Appearance No defects or abnormalities
Capacitance
Change Within
±
5% or
±
0.5pF
(Whichever is larger)
R6,R7,C8,L8,R9:Within
±
12.5%
E4,F5:Within
±
30%
Q/D.F. 30pF and over : Q
≧
350
10pF and over,
30pF and below:
Q
≧
275 + C
10pF and below:
Q
≧
200+10C
C:Nominal
Capacitance(pF)
[R6,R7,C8,L8]
W.V.:100V : 0.05max. (C < 0.068

F)
: 0.075max. (C
≧
0.068

F)
W.V.:25/50V :0.05max.
W.V.:16/10V :0.05max.
W.V.:6.3V/4V:0.075max. (C < 3.3

F)
:0.125max. (C
≧
3.3

F)
[R9]W.V.:50V: 0.075max.
[E4] W.V.:25Vmin.:0.05max.
[F5] W.V.:25Vmin.
:0.075max. (C

0.1

F) :0.125max. (C
≧
0.1

F)
W.V.:16/10V:0.15max. W.V.:6.3V:0.2max.
I.R. More than 1,000M

or 50

F(Whichever is smaller)
Dielectric
Strength No defects
17 Humidity Load The measured and observed characteristics should satisfy the specifications in
the following table Apply the rated voltage at 40
±
2

C and 90 to 95% humidity for
500
±
12 hours.
Remove and set for 24
±
2 hours at room temprature, then
measure.
The charge/discharge current is less than 50mA.
∙Initial measurement for F5/16Vmax.
Apply the rated DC voltage for 1 hour at 40
±
2

C .
Remove and set for 24
±
2 hours at room temperature.
Perform initial measurement.
Appearance No defects or abnormalities
Capacitance
Change Within
±
7.5% or
±
0.75pF
(Whichever is larger)
R6,R7,C8,L8,R9:Within
±
12.5%
E4:Within
±
30%
F5:Within
±
30% (W.V.>10V)
F5:30/-40% (W.V.
≦
10V)
Q/D.F. 30pF and over : Q
≧
200
30pF and below:
Q
≧
100 + C
C:Nominal
Capacitance(pF)
[R6,R7,C8,L8]
W.V.:100V : 0.05max. (C < 0.068

F)
: 0.075max. (C
≧
0.068

F)
W.V.:25/50V :0.05max.
W.V.:16/10V :0.05max.
W.V.:6.3V/4V:0.075max. (C < 3.3

F)
:0.125max. (C
≧
3.3

F)
[R9]W.V.:50V: 0.075max.
[E4] W.V.:25Vmin.:0.05max.
[F5] W.V.:25Vmin.
:0.075max. (C

0.1

F) :0.125max. (C
≧
0.1

F)
W.V.:16/10V:0.15max. W.V.:6.3V:0.2max.
I.R. More than 500M

or 25

∙F(Whichever is smaller)
Dielectric
Strength No defects
5
2
10
3
Step 1 2 3 4
Temp.(

C)
Min.
Operating
Temp. +0/-3
Room
Temp.
Max.
Operating
Temp. +3/-0
Room
Temp.
Time
(min.)
30
±
3 2 to 3 30
±
3 2 to 3

SPECIFICATIONS AND TEST METHODS
JEMCGS-0015Q 4