25
•
Align the calibration artifact to be used along the axis to be calibrated.
•
Measure a feature at each end of the calibration artifact and execute a “skew” alignment
between the features. You can also directly probe a skew feature along the artifact.
•
Using the simple crosshair, probe a point at the start of the segment to be used for correction.
•
Travel the distance of the machine axis and calibration artifact and take a point with the
crosshair precisely at the end of the known segment of your artifact.
•
Construct a distance between the two points and take note of the X or Y component of the
distance result (depending on the axis being calibrated).
•
Navigate to the LEC correction setup page for the axis you are calibrating.
Mx Button-->Setup-->Error corrections-->LEC-->X or Y LEC
•
Enter the (2) values into the “Standard” and “Observed” menu items. The standard value will be
the nominal or certified length of the segment used from your calibration artifact. The observed
value will be the measured X or Y distance from noted from step 5 above.
•
Set the Enable flag to Yes to activate the LEC correction for that axis.
3.3
Entering Segmented Linear Error Correction(SLEC)
Segmented Linear Error Correction(SLEC) applies a linear correction coefficient to a the DRO position
reading for a specific segment of travel within the full range of a given machine axis. This calculated
correction should reflect the actual amount of machine/encoder, for a particular segment within the
range of travel of a machine axis.
SLEC is entered into the Mx200 as 2 distinct values, “Standard” and “Observed” for each segment being
corrected. The standard value is the nominal or certified length of the segment from your calibration
artifact, and the observed value is the actual measurement that the Mx200 produces from that
particular segment.
•
Align the calibration artifact to be used along the axis to be calibrated.
•
Measure a feature at each end of the calibration artifact and execute a “skew” alignment
between the features. You can also directly probe a skew feature along the artifact.
•
Zero the X or Y position of the first feature in your string of correction segments.
