LANGER EMV-Technik P331-2, Руководство пользователя

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LANGER
EMV-Technik
DE-01728 Bannewitz
mail@langer-emv.de
www.langer-emv.com
P331-2 set
6 P331-2 ESD Generator (IEC 61000-4-2)
The probe is used to generate standard ESD pulses according to IEC 61000-4-2 for ESD injection
into the device under test via conductors (
Figure 2: P331-2 pulse form ).
The P331-2 probe allows the user to couple ESD into IC pins via conductors according to the
standard IEC 61000-4-2 both directly and indirectly via coupling networks (standard). Coupling
networks are used for coupling into interface connections or special high-speed interfaces such as
USB, LVDS, Ethernet, etc. Inductive or capacitive couplers are suitable coupling networks
(Information: Langer EMV-Technik GmbH).
6.1 Design and Function of the P331-2 Probe
Figure 1: Description of the P331-2 probe
The pin contact is the P331-2 probe's high-voltage (HV) output that is used to inject the ESD pulse
into the test IC.
The test pulse is generated in the probe through a high-voltage switch and the coupling networks
that are required by the standard (
Figure 2 ). The high voltage that is needed for the pulse
generation is generated in the BPS 203 and led to the HV port of the P331-2 probe via a high-
voltage cable. The BPS 203 controls the P331-2 probe. The signals are led to the control cable
port via a control cable. The pulse/contact LED indicates when an ESD pulse is triggered and the
device under test is contacted. The LED lights up green as soon as there is a galvanic connection
between the pin contact and the device under test. A red light signals the triggered pulses.
The Power LED signals the P331-2
probe’s power supply. The probe's GND contact area ensures
low impedance, all-over contact with the GND 25 ground plane. Magnets that are integrated in the
probe hold it on the ground plane.