LANGER EMV-Technik P331-2, Руководство пользователя

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LANGER
EMV-Technik
DE-01728 Bannewitz
mail@langer-emv.de
www.langer-emv.com
P331-2 set
7 Operational Notes
- The test set-up should always be operated via a filtered power supply.
- Attention! Functional near fields and interference emissions may occur when operating
EMC test set-ups. The user is responsible for taking measures to prevent any interference
to the correct function of products outside the EMC environment of the test set-up (in
particular through radiated interference).
This can be achieved by:
-
observing an appropriate safety distance,
-
use of shielded or shielding rooms.
-
The disturbances that are injected into the ICs can destroy (latch-up) the device under test if their
intensity is too high. Protect the device under test by:
- increasing the disturbance gradually and stopping when a functional fault occurs,
- interrupting the power supply to the device under test in the event of a latch-up.
- Attention! Make sure that internal functional faults are visible from outside. The device
under test may be destroyed due to an increase in the injection intensity if the faults are
not visible outside. Take the following measures as necessary:
- monitoring of representative signals in the device under test,
- special test software,
- visible reaction of the device under test to inputs (reaction test of the device under test).
We cannot assume any liability for the destruction of devices under test!