S530 Parametric Test System Test Subroutine Library User's Manual
Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015
3-11
Example
result = bvcbo(e, b, c, sub, ipgm, vlim, type);
Schematic
bvcbo1
This subroutine uses the
bsweepv
LPTLib function to measure collector-base breakdown voltage at a specified
current with the emitter open.
Usage
double bvcbo1(int
e
, int
b
, int
c
, int
sub
, double
vcbmin
, double
vcbmax
, int
nstep
, double
ipgm
, double
udelay
, char
type
);
e
Input
The emitter pin of the device
b
Input
The base pin of the device
c
Input
The collector pin of the device
sub
Input
The substrate pin of the device
vcbmin
Input
The starting collector-base voltage (V
CB
), in volts
vcbmax
Input
The ending V
CB
, in volts
nstep
Input
The number of voltage steps
ipgm
Input
The targeted collector-base current (I
CB
), in amperes
udelay
Input
Delay between V
CB
steps, in seconds
type
Input
Type of transistor:
"N"
or
"P"
Returns
Output
Collector-base voltage:
-1.0
= TYPE not "N" or "P"
+1.0E + 21
= Device triggered on
vcbmin
+2.0E + 21
= Device triggered on
vcbmax
