S530 Parametric Test System Test Subroutine Library User's Manual
Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015
3-5
Details
This subroutine is a revised version of the
(on page 3-3) subroutine that uses the LPTLib
searchi
and
trig
functions to search I
E
until the target I
CE
is reached.
This subroutine sets the current trigger on SMU1 at the specified I
CE
. The emitter current is searched
until the trigger is set. The emitter current is then forced, the collector current measured, and
is
calculated.
The percent error (
error
) is calculated between the target I
CE
and the final measured I
CE
and
returned.
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
SUB
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.
V/I polarities
NPN +I
CE
, +V
CB
, I
E,
-V
SUB
PNP -I
CE
, -V
CB
, +I
E
, -V
SUB
Source-measure units (SMUs)
SMU1: Forces V
CB
, maximum current limit, triggers on I
CE
SMU2: Forces 0.0 V, measures I
BE
SMU3: Searches I
E
, 3 V voltage limit
SMU4: Forces V
SUB
, default current limit
Example
result = beta2a(e, b, c, sub, ice, vcb, ie1, ie2, vsub, &icmeas, &ieout, &error);
Schematic