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BUENO ELECTRIC
BUENO ELECTRIC
BUENO ELECTRIC
BUENO ELECTRIC
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Fax: +86-25-51816989
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2.2.5 Group operation time (including relay inherent time)
Inherent time of fast operation zone: when it is measured at 1.2 times of setting,, no more than 40ms
Inherent time of differential operation: when it is measured at 1.5 times of setting, no more than 30ms
2.3 Insulation capability
2.3.1 Insulation resistance
The charged parts and uncharged parts casings, as well as irrelevant electrical circuits are easured by
Meg-ohmmeter with open-circuit voltage of 500V, to determine the value of nsulation resistance. Under
normal experiment atmospheric condition, each circuit insulation resistance of all levels could not be less than
20MΩ.
2.3.2 Medium intensity
Under normal experiment atmospheric condition, this device can endure frequency of 50Hz, signal input
terminal voltage to ground is 500V, and other circuit voltage to ground is 2000V. uring one-minute power
frequency voltage withstand test, there is not puncture, flashover and component damage event. During the test,
when any testing circuit is energized, all the other circuits are potential interconnected and grounded
equipotentially.
2.3.3 Impulse voltage
Under normal experiment atmospheric condition, the power input circuit, AC input circuit, output contact
circuit to ground, and all the circuits are able to endure short-time standard lightning impulse voltage test of
1.2/50μs, with open-circuit test voltage of 5kV.
2.3.4 Humidity and heat resistant performance
This device can endure the constant humidity and heat test stipulated in the GB/T 2423.9, with test
tempe40 ±2 , relative humidity
℃ ℃
（
93±3
）％，
and test time of 48h. Within two hours after the completion
of test, according to the requirements in 2.3.1, among the outside uncharged parts of each conductive circuit, the
casing and irrelevant electrical circuits, the insulation resistance is measured, to be not less than 1.5MΩ. The
medium voltage withstand intensity is not below the 75
％
of voltage amplitude in medium intensity test, as
stipulated in 2.3.2.
2.4 Anti-electromagnetic interference capability
2.4.1 Pulse interference
This device can endure the interference test stipulated in GB/T 14598.13-1998, and the test power frequency
is 100kHz and 1MHz, and test voltage is common-mode 2500V, with decaying oscillatory wave of differential
