Innoventions RAMCHECK LX, Руководство пользователя

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RAMCHECK LX OWNER’S MANUAL 1. INTRODUCTION
test flow and parameters using the change-on-the-fly and the
advanced setup features. Its test procedure is fully automatic, and
its graphic LCD display shows clear instructions and test results.
The special test sockets allow easy insertion and removal of the
modules.
Using our proprietary algorithms, RAMCHECK LX performs a
thorough test on your memory module. All the memory chips on
the module are tested simultaneously to detect errors that are caused
by interference among the chips. RAMCHECK LX is not merely a
go/no-go tester. It provides clear indications of faulty bits within a
module, as well as other important repair related information.
Pressing
activates the BASIC Test, which automatically
measures and displays the module size, mode type, fastest
functional frequency rate (or fastest RAS access time in
nanoseconds for EDO/FPM memory), and more. The BASIC test
concludes with a test summary:
Followed by detailed structure information.
You have the option to terminate the procedure at this point, as this
test is sufficient for most testing needs, however, if you decide to
test the module more rigorously, continue to the next phase.
The EXTENSIVE test follows the BASIC TEST with varying
conditions of the main voltage supplied to the memory device
(called Voltage Cycling and Voltage Bounce tests), all the while
having memory performance monitored. The March Up/Down
continues to exercise the module by using an algorithm to
determine adjacent cell interference. Following is a set of Data
Retention tests to provide you with information concerning the
quality of the tested module. Our proprietary Chip-Heat Mode
continues the test by automatically warming the module to test for
temperature related problems, which may come in the form of
speed degradation or memory failure. Such problems are reported
at the conclusion of the EXTENSIVE TEST.
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