Innoventions RAMCHECK LX, Руководство пользователя

Страница: 22 / 45

4. RAMCHECK LX OPERATION RAMCHECK LX OWNER’S MANUAL
Finally, we demonstrate the legacy EDO/FPM test results with a 168-pin
buffered module using one bank and two RAS control lines.
All the test results are
stored in the Test
Log. You can view
the Test Log of the
previous test by
pressing F4, F1 from
Standby.
The Test Log is
conveniently copied
to the PC when you
use the PC Real Time
interface described in
Section 6.
The Test Log
Please keep in mind that all speed and structure information is automatically
recorded into the Test Log, which is accessible by pressing F4 from standby
after the test. The information is retained in the Test Log until a new test is
initiated. The results from Extensive and Auto-Loop are also recorded.
Samples of the Test Log data for DDR1 (left) and DDR2 (right) modules are
shown in the following screens. Please note that what is shown is just a small
portion of a typical Test Log.
DDR1 DDR2
Refer to our on-line
manual addenda for
additional
information
regarding menus.
Basic Test Errors:
In case of data bits error, the test halts and the defective bits are indicated as
in the following message:
This type of error display is the most common and was described in Section
3.5.6. Pressing the

or

keys allows you to examine the memory array
two bytes at a time. In the above example, Bytes 7 and 8 are currently
selected, and the corresponding 8 bits per byte are displayed on the next line.
Pressing

allows you to move down one line to examine each defective bit.
PAGE 18