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KOMET 200 - 600
10.3.1.10
Sequence PA: Photo-cell testing
Prior to every gate movement a photocell test may be performed. The test
consists of two phases. During the first phase the supply of the transmitters is
switched off. The controller expects within the next 2.5 s that the receiver
reports an obstacle. During the second phase the supply of the transmitter is
switched on again. The controller expects the receiver to report no obstacle
any more. Only after this procedure the gate can move. If an error occurs in
the first phase, the photocell (receiver) is damaged. The gate will not move.
An error message is given through the display. If an error occurs in the second
phase, the controller interprets this as a real obstacle. The gate will not move.
No error message is given. You may connect and test each (LSI and LSA)
maximum 6 pairs of photocells with the controller MO 36. Therefore add all
n.c. relay contacts of the receivers in serial. Parallel to each relay contact you
must add a
1kOhm resistor
(resistors are needed only when photocell test is
used).
Drawing 14
ATTENTION!
The MO 36 must learn how many photocells are connected to it.
Activate the test by setting PA = ON and run the learning of the running
distance P1.
After this please check every single photocell for proper function.
REMARK:
When a faulty photo-cell is detected during photo-cell testing or
when an obstacle is present within the photo-cell, the gate can be opened and
closed in emergency mode (dead man’s function).
When sequence
PA
is activated by
button LERN
, the present selection for
the photo-cell testing is displayed. With the
button BT
the value can be
selected (see table).Return to the learning sequence using
button LERN
.
Display Corresponds
to:
xf
Photo-cell testing deactivated
xn
Photo-cells, which have past the LS-Test during sequence
P1, will execute photo-cell testing also in regular mode.
36