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CY7C1310AV18

CY7C1312AV18

CY7C1314AV18

 PRELIMINARY

Document #: 38-05497 Rev. *A

Page 14 of 21

is loaded into the instruction register upon power-up or

whenever the TAP controller is given a test logic reset state.

SAMPLE Z

The SAMPLE Z instruction causes the boundary scan register

to be connected between the TDI and TDO pins when the TAP

controller is in a Shift-DR state. The SAMPLE Z command puts

the output bus into a High-Z state until the next command is

given during the “Update IR” state.

SAMPLE/PRELOAD

SAMPLE / PRELOAD is a 1149.1 mandatory instruction.

When the SAMPLE / PRELOAD instructions are loaded into

the instruction register and the TAP controller is in the Cap-

ture-DR state, a snapshot of data on the inputs and output pins

is captured in the boundary scan register. 
The user must be aware that the TAP controller clock can only

operate at a frequency up to 10 MHz, while the SRAM clock

operates more than an order of magnitude faster. Because

there is a large difference in the clock frequencies, it is possi-

ble that during the Capture-DR state, an input or output will

undergo a transition. The TAP may then try to capture a signal

while in transition (metastable state). This will not harm the

device, but there is no guarantee as to the value that will be

captured. Repeatable results may not be possible.
To guarantee that the boundary scan register will capture the

correct value of a signal, the SRAM signal must be stabilized

long enough to meet the TAP controller's capture set-up plus

hold times (t

CS

 and t

CH

). The SRAM clock input might not be

captured correctly if there is no way in a design to stop (or

slow) the clock during a SAMPLE / PRELOAD instruction. If

this is an issue, it is still possible to capture all other signals

and simply ignore the value of the CK and CK# captured in the

boundary scan register.
Once the data is captured, it is possible to shift out the data by

putting the TAP into the Shift-DR state. This places the bound-

ary scan register between the TDI and TDO pins.
PRELOAD allows an initial data pattern to be placed at the

latched parallel outputs of the boundary scan register cells pri-

or to the selection of another boundary scan test operation.

The shifting of data for the SAMPLE and PRELOAD phases 

can occur concurrently when required - that is, while data 

captured is shifted out, the preloaded data can be shifted in.

BYPASS

When the BYPASS instruction is loaded in the instruction 

register and the TAP is placed in a Shift-DR state, the bypass 

register is placed between the TDI and TDO pins. The 

advantage of the BYPASS instruction is that it shortens the 

boundary scan path when multiple devices are connected 

together on a board.

EXTEST

The EXTEST instruction enables the preloaded data to be 

driven out through the system output pins. This instruction also 

selects the boundary scan register to be connected for serial 

access between the TDI and TDO in the shift-DR controller 

state.

EXTEST OUTPUT BUS TRI-STATE

IEEE Standard 1149.1 mandates that the TAP controller be

able to put the output bus into a tri-state mode. 
The boundary scan register has a special bit located at bit #47.

When this scan cell, called the "extest output bus tristate", is

latched into the preload register during the "Update-DR" state

in the TAP controller, it will directly control the state of the

output (Q-bus) pins, when the EXTEST is entered as the

current instruction. When HIGH, it will enable the output

buffers to drive the output bus. When LOW, this bit will place

the output bus into a High-Z condition. 
This bit can be set by entering the SAMPLE/PRELOAD or

EXTEST command, and then shifting the desired bit into that

cell, during the "Shift-DR" state. During "Update-DR", the

value loaded into that shift-register cell will latch into the

preload register. When the EXTEST instruction is entered, this

bit will directly control the output Q-bus pins. Note that this bit

is pre-set HIGH to enable the output when the device is

powered-up, and also when the TAP controller is in the

"Test-Logic-Reset" state. 

Reserved

These instructions are not implemented but are reserved for

future use. Do not use these instructions. 

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Содержание CY7C1310AV18

Страница 1: ...ead operations and the Write Port has dedicated Data Inputs to support Write opera tions QDR II architecture has separate data inputs and data outputs to completely eliminate the need to turn around t...

Страница 2: ...ata Reg RPS WPS Q 17 0 Control Logic Address Register Reg Reg Reg 18 19 18 36 18 BWS 1 0 VREF Write Add Decode 18 A 18 0 19 C C 18 512K x 18 Array 512K x 18 Array Write Reg Write Reg CQ CQ 18 DOFF Log...

Страница 3: ...VREF NC NC VDDQ NC VDDQ NC NC VDDQ VDDQ VDDQ D1 VDDQ NC Q1 NC VDDQ VDDQ NC VSS NC D0 NC TDI TMS VSS A NC A NC D2 NC ZQ NC Q0 NC NC NC NC A CY7C1312AV18 1M 18 11 15 BGA 2 3 4 5 6 7 1 A B C D E F G H J...

Страница 4: ...tten into the device A Input Synchronous Address Inputs Sampled on the rising edge of the K read address and K write address clocks during active read and write operations These address inputs are mul...

Страница 5: ...to drive out data through Q x 0 when in single clock mode CQ Echo Clock CQ is referenced with respect to C This is a free running clock and is synchronized to the output clock C of the QDR II In the s...

Страница 6: ...on of wait states in a depth expanded memory Write Operations Write operations are initiated by asserting WPS active at the rising edge of the Positive Input Clock K On the same K clock rise the data...

Страница 7: ...et by slowing the cycle time of input clocks K and K to greater than 30 ns Application Example 1 Truth Table 2 3 4 5 6 7 Operation K RPS WPS DQ DQ Write Cycle Load address on the rising edge of K cloc...

Страница 8: ...es during this portion of a write operation H H L H No data is written into the devices during this portion of a write operation Write Cycle Descriptions CY7C1314AV18 2 8 BWS0 BWS1 BWS2 BWS3 K K Comme...

Страница 9: ...t LOW Voltage 12 13 0 3 VREF 0 1 V VIN Clock Input Voltage 0 3 VDDQ 0 3 V IX Input Load Current GND VI VDDQ 5 5 A IOZ Output Leakage Current GND VI VDDQ Output Disabled 5 5 A VREF InputReferenceVoltag...

Страница 10: ...tCQOH tCHCQX Echo Clock Hold after C C Clock Rise 0 50 0 50 ns tCQD tCQHQV Echo Clock High to Data Valid 0 40 0 40 ns tCQDOH tCQHQX Echo Clock High to Data Invalid 0 40 0 40 ns tCHZ tCHZ Clock C and C...

Страница 11: ...CCLK Clock Input Capacitance 6 pF CO Output Capacitance 7 pF AC Test Loads and Waveforms Note 20 Tested initially and after any design or process change that may affect these parameters 1 25V 0 25V R...

Страница 12: ...if address A2 A1 then data Q20 D10 and Q21 D11 Write data is forwarded immediately as read results This note applies to the whole diagram Read Write Deselect Sequence K 1 2 3 4 5 8 10 6 7 K RPS WPS A...

Страница 13: ...is placed between the TDI and TDO pins as shown in TAP Controller Block Diagram Upon power up the instruction register is loaded with the IDCODE instruction It is also loaded with the IDCODE instruct...

Страница 14: ...ter between the TDI and TDO pins PRELOAD allows an initial data pattern to be placed at the latched parallel outputs of the boundary scan register cells pri or to the selection of another boundary sca...

Страница 15: ...ents the value at TMS at the rising edge of TCK TAP Controller State Diagram 24 TEST LOGIC RESET TEST LOGIC IDLE SELECT DR SCAN CAPTURE DR SHIFT DR EXIT1 DR PAUSE DR EXIT2 DR UPDATE DR SELECT IR SCAN...

Страница 16: ...tage IOL 2 0 mA 0 4 V VOL2 Output LOW Voltage IOL 100 A 0 2 V VIH Input HIGH Voltage 0 65VDD VDD 0 3 V VIL Input LOW Voltage 0 3 0 35VDD V IX Input and OutputLoad Current GND VI VDD 5 5 A Note 25 Thes...

Страница 17: ...imes tTMSH TMS Hold after TCK Clock Rise 10 ns tTDIH TDI Hold after Clock Rise 10 ns tCH Capture Hold after Clock Rise 10 ns Output Times tTDOV TCK Clock LOW to TDO Valid 20 ns tTDOX TCK Clock LOW to...

Страница 18: ...dor ID code and places the register between TDI and TDO This operation does not affect SRAM operation SAMPLE Z 010 Captures the Input Output contents Places the boundary scan register between TDI and...

Страница 19: ...1 6C 52 8A 53 7A 54 7B 55 6B 56 6A 57 5B 58 5A 59 4A 60 5C 61 4B 62 3A 63 1H 64 1A 65 2B 66 3B 67 1C 68 1B 69 3D 70 3C 71 1D 72 2C 73 3E Boundary Scan Order continued Bit Bump ID 74 2D 75 2E 76 1E 77...

Страница 20: ...names mentioned in this document are the trademarks of their respective holders Ordering Information Speed MHz Ordering Code Package Name Package Type Operating Range 167 CY7C1310AV18 167BZC BB165D 13...

Страница 21: ...nt History Page Document Title CY7C1310AV18 CY7C1312AV18 CY7C1314AV18 18 Mb QDR II SRAM 2 Word Burst Architecture Document Number 38 05497 REV ECN No Issue Date Orig of Change Description of Change 20...

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