DS1113F1
13
CS4399
3 Characteristics and Specifications
Other characteristics
for AOUTx
Interchannel gain mismatch (defined in
—
±0.1
—
dB
Interchannel phase mismatch (defined in
)
—
±0.05
—
°
Output offset voltage: Mute (defined in
)
—
±0.5
±1
mV
Gain drift (defined in
)
—
±100
—
ppm/°C
Load resistance (R
L
)
600
—
—
Load capacitance (C
L
)
—
—
1
nF
—
—
10
ms
Click/pop during PDN_HP enable or disable
A-weighted
—
—
–60
dBV
1.This table also applies to external VCP_FILT supply mode: CS4399 power up procedure is per description in
; EXT_VCPFILT = 1; VCP_
FILT+ and VCP_FILT– comply to
when EXT_VCPFILT = 1; in this mode, HV_EN setting becomes don’t care.
2.One LSB of triangular PDF dither is added to PCM data.
3.Referred to the typical full-scale voltage. Applies to all THD+N and dynamic range values in the table.
4.DSD performance may be limited by the source recording. 0 dB-SACD = 50% modulation index.
5.The volume must be configured as indicated to achieve specified output characteristics.
6.Output test configuration. Symbolized component values are specified in the test conditions.
Table 3-5. Combined DAC Digital, On-Chip Analog and AOUTx Filter Characteristics
Test conditions (unless specified otherwise): The filter characteristics have been normalized to the sample rate (Fs) and can be referenced to the desired
sample rate by multiplying the given characteristic by Fs. Single-Speed Mode refers to 32-, 44.1-, and 48-kHz sample rates. Double-Speed Mode refers
to 88.2- and 96-kHz sample rates. Quad-Speed Mode refers to 176.4- and 192-kHz sample rates. Octuple-Speed Mode refers to 352.8- and 384-kHz
sample rates. MCLK_INT is an integer multiple of Fs; HPF disabled; no DC offset applied; group delay does not include serial port delay.
Parameter
Minimum Typical Maximum Units
Fast Roll-Off
(
= 0)
Single-Speed Mode
1
Passband
2
to –0.01-dB corner
to –3-dB corner
attenuation @ Fs/2
0
0
8.44
3
—
—
—
0.4535
4
0.49
—
Fs
Fs
dB
Passband ripple 10 Hz to –0.01-dB corner
5
–0.01
—
+0.01
dB
Stopband
0.547
—
—
Fs
Stopband attenuation
6
= 0
PHCOMB_LOWLATB = 1
110
7
105
—
—
—
—
dB
dB
Group delay (linear phase)
PHCOMB_LOWLATB = 1
—
39.5/Fs
8
—
s
Group delay (minimum phase)
PHCOMB_LOWLATB = 0
—
6.3/Fs
9
—
s
Deemphasis error
10
(Relative to 1 kHz)
Fs = 44.1 kHz
—
—
±0.14
dB
Fast Roll-Off
(
= 0)
Double-Speed Mode
Passband
to –0.01-dB corner
to –3-dB corner
attenuation @ Fs/2
0
0
7.77
—
—
—
0.227
0.48
—
Fs
Fs
dB
Passband ripple 10 Hz to –0.01-dB corner
–0.01
—
0.01
dB
Stopband
0.583
—
—
Fs
Stopband attenuation
80
—
—
dB
Group delay (linear phase)
PHCOMB_LOWLATB = 1
—
22.3/Fs
—
s
Group delay (minimum phase)
PHCOMB_LOWLATB = 0
—
7.5/Fs
—
s
Table 3-4. Analog Output Characteristics (HV_EN = 1)
1
(Cont.)
Test conditions (unless otherwise specified):
Fig. 2-1
shows CS4399 connections; input test signal is a 32-bit, full-scale 997-Hz sine wave (unless specified
otherwise); GNDA = GNDCP = GNDD = 0 V; voltages are with respect to ground; ASP_M/Sb = 1; typical, min/max performance data taken with VA =
VCP = 1.8 V; VL = VD = 1.8 V; VP = 3.6 V; T
A
= +25°C; measurement bandwidth is 20 Hz–20 kHz; ASP_SPRATE = 0001 (LRCK = 44.1-kHz mode);
PDN_XTAL = 0, MCLK_INT = 1, and MCLK_SRC_SEL = 00 (crystal frequency f
XTAL
= 22.5792 MHz); Volume = 0 dB; when testing in DSD processor
mode, DSD_ZERODB = 1
;
when testing noise related specifications (dynamic range, THD+N, idle channel noise), no external impedance on REFx.
PCM and DSD Processor Mode Parameter
2,3,4
Minimum
Typical
Maximum
Units
Test Load
AOUTA
C
LA
REFA
R
LA
Measurement
Device
–
+
–
+
AOUTB
REFB
CH1
CH2
C
LB
R
LB