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Technical Information
7.
Sensor Defect Specifications
7.1.
Parameter
Description
Limit
BrightPix
Amount of bright pixels (response higher then half
scale) in a dark image. Dark image must first be
FPN corrected.
< 10
DarkMeanOutput
Average value of a dark image (10-bit scale).
0 < x < 235
50%MeanOutput
Average value of a half scale image (10-bit scale). 390 < x < 547
FPN
Fixed pattern noise of a dark image should be
smaller than 3.1% of the signal swing
< 3.1%
TotDefects
Amount of defect pixels in a half scale image. A de-
fect pixel is defined as a pixel that has a response
that is 20% off the median response of all pixels.
The half scale image must be FPN corrected.
< 20
BadColumnOutput Amount of bad columns in a half scale image. A
bad column is defined as a column that has a re-
sponse that is 10% off the median of the surround-
ing 40 columns. The half scale image needs to be
FPN corrected.
0
BadRow
Amount of bad rows in a half scale image. A bad
row is defined as a row that has a response that
is 10% off the median of the surrounding 40 rows.
The half scale image needs to be FPN corrected.
0
Cluster
Amount of clusters allowed
See note.
0
Coverglass
Dig/Scratch
Uniform illumination. Test sensor for defective pixels.
Defects on cover glass will generate defect pixels.
No defect pixels may be visible.
0
Measurement Conditions
Illumination source: High brightness led light source (white) Using a pinhole to imitate
the lens setup in the application. F=5.4
Temperature is 25ºC (logged during the test program) and 30 ºC on wafer.
Dark current limit is set at 30 ºC
Definition of operation conditions:
Nominal clock frequency is 310 MHz.
Unity Gain
Power supplies as specified in the datasheet (recommended operation conditions)
Integr. times: Dark image short IT: 4μs, Dark image long IT: 1s, Other images: 2ms
Notice
A cluster is defined as a group of minimal 2 and maximum 4 neighboring defect pixels
(top, bottom or side; not diagonal). Clusters that exceed the maximum of 4 defect pixels
are not allowed at all.
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