Test Issues
6-2
Copyright © 1998, 1999 ARM Limited. All rights reserved.
ARM DDI0145B
6.1
About testing
The ARM9TDMI processor core supports parallel and serial test methodologies. The
parallel test patterns are derived from assembler ARM code programs written to achieve
a high fault coverage.
The ARM9TDMI processor core has a fully JTAG-compatible scan chain which
intersects all the inputs and outputs. This allows the test patterns to be serialized and
injected to the processor via the JTAG interface. Both the parallel and serial test patterns
are supplied to ARM9TDMI processor core licensees. The scan chain also supports
EXTEST, allowing the connections between the ARM9TDMI processor core and other
JTAG-compatible peripherals to be tested.
Содержание ARM9TDMI
Страница 1: ...Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ARM9TDMI Technical Reference Manual ...
Страница 6: ...Contents vi Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Страница 12: ...Preface xii Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Страница 16: ...Introduction 1 4 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Страница 22: ...Programmer s Model 2 6 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Страница 36: ...ARM9TDMI Processor Core Memory Interface 3 14 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Страница 54: ...ARM9TDMI Coprocessor Interface 4 18 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Страница 110: ...Test Issues 6 6 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Страница 138: ...ARM9TDMI AC Characteristics 8 20 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Страница 150: ...ARM9TDMI Signal Descriptions A 12 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...
Страница 154: ...Index Index 4 Copyright 1998 1999 ARM Limited All rights reserved ARM DDI0145B ...