FEATURES & FUNCTIONALITY
Neo
SECTION 2
Page 36
2.5 - DUAL AMPLIFIER DYNAMIC RANGE
The Dual Amplifier architecture of the sCMOS sensor in Neo uniquely circumvents the need to choose between
low noise or high capacity, in that signal can be sampled simultaneously by both high gain and low gain
amplifiers. As such, the lowest noise of the sensor can be harnessed alongside the maximum well depth,
affording the widest possible dynamic range. Traditionally, scientific sensors including CCD, EMCCD, ICCD and
CMOS, demand that the user must select ‘upfront’ between high or low amplifier gain (i.e. sensitivity) settings,
depending on whether they want to optimise for low noise or maximum well depth. Since the true dynamic
range of a sensor is determined by the ratio of well depth divided by the noise floor detection limit, then
choosing either high or low gain settings will restrict dynamic range by limiting the effective well depth or noise
floor, respectively.
For example, consider a large pixel CCD, with 16-bit Analogue to Digital Converter (ADC), offering a full well
depth of 150,000 e
-
and lowest read noise floor of 3 e
-
. The gain sensitivity required to give lowest noise is
1 e
-
/ADU (or ‘count’) and the gain sensitivity required to harness the full well depth is 2.3 e
-
/ADU, but with a
higher read noise of 5 e
-
. Therefore, it does not automatically follow that the available dynamic range of this
sensor is given by 150,000/3 = 50,000:1. This is because the high sensitivity gain of 1e
-
/ADU that is used to
reach 3 e
-
noise means that the 16-bit ADC will top out at 65,536 e
-
, well short of the 150,000 e
-
available from
the pixel. Therefore, the actual dynamic range available in ‘low noise mode’ is 65,536/3 = 21,843:1. Conversely,
the lower sensitivity gain setting means that the ADC will top out at ~ 150,000 e
-
, but the higher read noise of
5 e
-
will still limit the dynamic range to 150,000/5 = 30,000:1 in this ‘high well depth mode’. The sCMOS sensor
offers a unique dual amplifier architecture, meaning that signal from each pixel can be sampled simultaneously
by both high and low gain amplifiers. The sensor also features a split readout scheme in which the top and
bottom halves of the sensor are read out independently. Each column within each half of the sensor is equipped
with dual column level amplifiers and dual analog-to-digital converters, represented by the block diagram below:
Figure 12: Amplifiers & ADC
Содержание Neo sCMOS
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Страница 17: ...INTRODUCTION Neo SECTION 1 Page 17 1 5 1 Mechanical drawings...
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