AmScope MU USB2.0, Руководство пользователя

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MU Series (Windows)
User’s Manual
Process Menu Tools
Extended Depth of Focus (EDF)
The “Extended Depth of Focus” function allows a user to capture multiple images from varying focal planes
and assemble them into a single image with greater depth within focus than a single image. This is useful when
viewing with high magnification, which has a limited depth of focus, or when capturing images of three dimen -
sional figures (such as when doing circuit board work, or viewing minerals).
Note: The EDF function can be used with previously captured images, or it can be used to capture images as
part of the tool. We will display it as if capturing with the tool, however, the user has the choice to perform the
image capture however desired. To use them from the browse menu, simply shift+left click all of the desired
images to use in your stacked image, right click to bring up the context menu, and click the “EDF” tool from the
list.
1. Clicking the “EDF...” tool will bring up the capture image option if no other images are currently captured in
the viewing area. From here, move the focus of the microscope to the top of the range, so that it is focused on
the topographical tallest plane of the sample you wish to focus on. In layman’s terms, focus it so that the tall -
est items in your sample are within focus. Typically, this means moving the stage or microscope head (depend -
ing on your microscope type) to the farthest point away from the sample while still focusing on a part of the
sample.