![Agilent Technologies 85225F Скачать руководство пользователя страница 46](http://html.mh-extra.com/html/agilent-technologies/85225f/85225f_installation-and-user-manual_2867939046.webp)
46
Installation and User’s Guide
1
Introducing the Agilent 85225F Performance Modeling System
The 1/f Noise Subsystem
The Agilent 35670A dynamic signal analyzer (in conjunction with a
customer- furnished Stanford Model SR570 low noise amplifier) measures
the flicker noise (1/f noise) of active devices. Controlled by IC- CAP device
modeling software, the dynamic signal analyzer generates reliable 1/f noise
measurement data, which are analyzed and extracted in IC- CAP.
Figure 17
shows the system configuration for 1/f noise measurements.
Figure 16
System Block Diagram
Содержание 85225F
Страница 1: ...Agilent Technologies Agilent 85225F PerformanceModelingSystem Installation and User s Guide ...
Страница 90: ...90 Installation and User s Guide 2 Installing the System ...
Страница 102: ...102 Installation and User s Guide 3 Verifying System Functionality ...
Страница 110: ...110 Installation and User s Guide 4 Servicing the System ...
Страница 118: ...118 Installation and User s Guide A Enhancing Measurement Accuracy ...
Страница 128: ...128 Installation and User s Guide C RF Subsystem Functional Verification Test ...
Страница 144: ...144 Installation and User s Guide G Network Analyzer Performance Specification Summary Transmission Measurements ...
Страница 148: ...148 Installation and User s Guide Index ...