ABB RELION REB670, Руководство по вводу в эксплуатацию

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1. Connect the currents I1 and I2 from the three-phase test set test set to the
current terminals of CT1 and CTx inputs of the IED as shown in Figure
13 .
2. Make sure that the current measurement from CT1 and CTx inputs are
included into the same differential zone (see the previous test instructions for
more details).
3. Set the current I1 (that is, current connected to input CT1) to the nominal
secondary value (normally 1A or 5A) at 0°, see the formula (Equation
1 ).
4. Set the current I2(that is, connected to current input CTx) to the value
calculate as follows:
CTprimx
2 0.85 CTsecx 0.85 CTsec1 ,
1 CTprim1
ratio
ratio
CTx
I
CT
     
IECEQUATION16067 V1 EN-US
(Equation 3)
Where
CTprimk
, 1
CTseck
CTk k
ratio
 
or x
. The configuration parameter CTseck
represents the rated secondary current of the current input CTk, while the
configuration parameter
CTprimk represents the rated primary current.
5. Make sure there is enough current for slow open CT algorithm to operate,
when the current is disconnected later during testing, by checking that the
value of the product 0.15 × I2 ×
CTprim1 is bigger than the value of
OCTOperLev . If not, increase the current into CT1 input until this condition is
satisfied and change the current into input CTx accordingly.
6. Set the phase angle of the current I2, as explained in the previous sections.
7. Inject these two currents into the IED. Observe that the differential function
shall be stable. Write down the service values for incoming and differential
currents for the phase L1. Observe that the differential current should be
approximately 15% of the incoming current.
8. After pre-set time determined by parameter tSlow OCT , open CT condition
shall be detected by the IED. The differential function behavior shall be in
accordance with the set value of the parameter
SlowOCTOper .
9. Check that open CT alarm contacts operate accordingly to the scheme wiring.
10. Check that open CT information is stored in the event list (if connected).
11. Switch off the currents.
12. Reset the open CT blocking in the reset menu of the local HMI.
13. Check that open CT reset information is stored in the event list (if connected).
14. Repeat the same test procedure for the phases L2 and L3.
10.3.1.6 Completing the test
GUID-716ABD3A-301C-4E1B-A060-743E12CD3A96 v1
Continue to test another function or end the test. Restore connections and settings
to their original values, if they were changed for testing purposes.
10.3.1.7 Check of trip circuits and circuit breakers
SEMOD65863-3 v3
The trip circuits are tested as part of the secondary/primary injection test.
1MRK 505 372-UEN A
Section 10
Testing functionality by secondary injection
Busbar protection REB670 2.2 IEC 89
Commissioning manual