UTD2000M
User
Manual
Fig.
3
‐
3
Reduce
Random
Noise
in
a
Signal
Operation
Steps
are
the
followings:
1
．
Set
the
probe
and
the
attenuation
coefficient
of
CH1
channel
the
same
way
as
in
the
former
case.
2
．
Connect
to
the
signal
and
make
the
waveform
display
steadily
on
the
screen
of
the
Oscilloscope.
Refer
to
former
case
for
detailed
operation.
See
corresponding
descriptions
in
the
foregoing
chapters
for
the
adjustment
of
time
base
and
vertical
scale.
3.
Improve
trigger
by
setting
trigger
coupling.
(1).
Press
MENU
key
located
in
the
trigger
area
to
display
trigger
setup
menu;
(2).
Set
trigger
coupling
in
low
frequency
or
high
frequency
reject.
Low
frequency
reject
is
about
setting
up
a
high
‐
pass
filter
to
filter
low
frequency
signal
component
that
is
below
80
Hz
and
allow
high
frequency
signal
component
to
pass,
whereas
high
frequency
reject
is
about
setting
up
a
low
‐
pass
filter
to
filter
high
frequency
signal
component
that
is
above
80
Hz
and
allow
low
frequency
signal
component
to
pass.
By
setting
up
the
low
or
high
frequency
rejects
respectively,
low
or
high
frequency
noise
can
be
rejected,
thus
to
acquire
stable
trigger;
1.
Reduce
displayed
noise
by
setting
sampling
mode
If
random
noise
is
contained
in
the
signal
under
test,
it
will
result
in
a
waveform
that
is
too
coarse.
Therefore,
average
sampling
method
or
high
resolution
should
be
applied
in
this
case
so
as
to
eliminate
the
display
of
random
noise
and
make
the
waveform
slimmer
for
the
ease
of
observation
and
measurement.
Reduce
random
noise
using
average
mode
Random
noise
has
been
reduced
and
it
is
easier
to
observe
details
of
a
signal
once
average
value
is
taken,
detailed
operation
are:
Press
ACQUIRE
key
located
on
menu
area
of
the
panel
to
display
sampling
setting
menu.
Press
F1
and
then
press
“MULTIPURPOSE”
knob
to
set
sampling
mode
to
“average”
state
and
press
“SELECT”
to
confirm.
Next,
adjust
the
average
times
by
turning
“MULTIPURPOSE”
knob,
which
steps
forward
from
2
to
512,
in
power
of
2
times,
till
the
display
of
waveform
meets
the
observation
and
measurement
demand
(See
below
picture).
65
