MSP430F41x2
MIXED SIGNAL MICROCONTROLLER
SLAS648E -- APRIL 2009 -- REVISED MARCH 2011
9
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions (continued)
TERMINAL
NO.
I/O
DESCRIPTION
NAME
64
PIN
48
PIN
I/O
DESCRIPTION
P7.3/TCK/S35
57
41
I/O
General-purpose digital I/O pin
Test clock input for device programming and test
LCD segment output
P7.4/TA1.4/
A0/CA2
60
44
I/O
General-purpose digital I/O pin
Timer1_A5, capture: CCI4B input, compare: Out4 output
ADC10 analog input A0
Comparator_A input 2
P7.5/TA1.3/
A1/CA3
61
45
I/O
General-purpose digital I/O pin
Timer1_A5, capture: CCI3B input, compare: Out3 output
ADC10 analog input A1
Comparator_A input 3
P7.6/TA0.2/S25
45
--
I/O
General-purpose digital I/O pin
Timer0_A3, capture: CCI2A input, compare: Out2 output
LCD segment output
AV
CC
64
48
Analog supply voltage, positive terminal
AV
SS
62
46
Analog supply voltage, negative terminal
DV
CC
7
3
Digital supply voltage, positive terminal. Supplies all digital parts.
DV
SS
10
6
Digital supply voltage, negative terminal. Supplies all digital parts.
XOUT
9
5
O
Output port for crystal oscillator XT1. Standard or watch crystals can be connected.
XIN
8
4
I
Input port for crystal oscillator XT1. Standard or watch crystals can be connected.
RST/NMI/
SBWTDIO
58
42
I
Reset or nonmaskable interrupt input
Spy-Bi-Wire test data input/output during programming and test
TEST/SBWTCLK
59
43
I
Selects test mode for JTAG pins on Port7. The device protection fuse is connected to TEST.
Thermal Pad
NA
NA
NA
QFN package pad (RGZ package only). Connection to DV
SS
is recommended.
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