Assembly And Maintenance Manual for Telink BLE 1x6 Test System 3.2
AN-18071200-E1
37
Ver 1.0.0
2)
Example 2: DUT is MKD (Mouse, Keyboard, Dongle) set with OTP.
Index
Name
Description
Parameter
Maintenance
Suggestion
0
CurProtection
current protection:
test DUT current
current value
Maybe soldering
problem.
Re-solder IC.
1
GpioShort
test if there is any GPIO pins
short wired
show the two pins if
there is a short;
if not, its value will
be 0
2
TpHigh
TP high/ low frequency test:
Carry
out
Tx modulation
calibration to ensure RF Tx
quality
cap value
RF related.
Test
again;
if
failed, temporarily
mark it as rejected
product, and wait
for
subsequent
analysis.
3
TpLow
cap value
4
TxHiCnt
tx high frequency counting
value/power/frequency
offset/current test:
EVK
receives
packets
transmitted by DUT at high
frequency point, and thus to
test DUT Tx performance at
high frequency point.
Test parameters are DUT Tx
packet number, DUT Tx power,
DUT Tx frequency offset and
DUT Tx current, successively.
cnt num
5
TxHiPower
rf energy
6
TxHiFreoffset
frequency offset
7
TxHiCurrent
current value
8
TxLoCnt
tx low frequency counting
value/power/frequency
offset/current test:
EVK
receives
packets
transmitted by DUT at low
frequency point, and thus to
test DUT Tx performance at
low frequency point.
Test parameters are DUT Tx
packet number, DUT Tx power,
DUT Tx frequency offset and
DUT Tx current, successively.
cnt num
9
TxLoPower
rf energy
10
TxLoFreoffset
frequency offset
11
TxLoCurrent
current value
Telink
for
customer
