Assembly And Maintenance Manual for Telink BLE 1x6 Test System 3.2
AN-18071200-E1
35
Ver 1.0.0
Index
Name
Description
Parameter
Maintenance
Suggestion
12
RxLoCnt
rx low frequency counting
value/power/current test:
DUT
receives
packets
transmitted by EVK at low
frequency point, and thus to
test DUT Rx performance at
low frequency point.
Test parameters are EVK Tx
packet number, EVK Tx power
and
EVK
Tx
current,
successively.
cnt num
RF related.
Test
again;
if
failed, temporarily
mark it as rejected
product, and wait
for
subsequent
analysis.
13
RxLoPower
rf energy
14
RxLoCurrent
current value
15
RxHiCnt
rx high frequency counting
value/power/current test:
DUT
receives
packets
transmitted by EVK at high
frequency point, and thus to
test DUT Rx performance at
high frequency point.
Test parameters are EVK Tx
packet number, EVK Tx power
and
EVK
Tx
current,
successively.
cnt num
16
RxHiPower
rf energy
17
RxHiCurrent
current value
18
CancleFlashProtection
cancel flash protection:
Cancel
DUT
flash
write
protection for following flash
erase and test.
0, always
Flash related.
Maybe soldering
problem, re-solder
pins related to
Flash.
19
FlashZero
set flash as 0/ 0xff:
Write DUT flash with all “0” or
all “1” to test flash write
operation.
size
20
FlashErase
size
21
DsSlpCur
deep sleep current/wakeup,
suspend current/wakeup test:
Make DUT enter low-power
mode (deep sleep/suspend)
and then wake it up via EVK,
thus to test current in deep
sleep mode, wakeup function
from deep sleep mode, current
in suspend mode and wakeup
function from suspend mode.
current value
Maybe
bad
contact
with
thimble. Check if
there’s
enough
solder paste for
the test points of
thimble and PCBA.
22
DsSlpWkp
reg value
23
SuspendCur
current value
24
SuspendWkp
reg value
Telink
for
customer
