SanDisk SSD X100
Product Manual (Released)
Rev 1.0
© 2011 SanDisk® Corporation
28
Document No. 80-11-01842
6.
Reliability Characteristics
6.1
Error Rate
Non-recoverable error rate is 1 error per 10
16
bits read.
6.2
MTTF (Mean-Time-To-Failure)
The reliability figure of merit most often used for electronic equipment is Mean-Time-To-Failure
(MTTF). SanDisk estimates MTTF using a prediction methodology based in accordance with the
Telcordia Special Report SR-332. The prediction is based on a Parts Stress Analysis.
Quality levels were defined as industrial grade (I) for all of the components. The detailed
prediction for the system was performed at a temperature of 25°C in a GB environment.
The following table summarizes the estimated MTTF results for each capacity.
Capacity
Condition
MTTF (Hours)
32GB
Telcordia SR-332, GB, 25°C
2,000,000
64GB
Telcordia SR-332, GB, 25°C
2,000,000
128GB
Telcordia SR-332, GB, 25°C
2,000,000
256GB
Telcordia SR-332, GB, 25°C
2,000,000
512GB
Telcordia SR-332, GB, 25°C
2,000,000
Table
6-1: SanDisk SSD X100 MTTF