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360 Herndon Parkway 

 Suite 

1400 

 

Herndon, VA 20170 

 http://www.rheintech.com 

 

SanDisk Corporation 

 

 

 

 

 

 

 

 

           Page 9 of 17 

DoC Report 
2006137 
04/27/07 

 

4 CONDUCTED 

EMISSIONS 

 

4.1  SITE AND TEST DESCRIPTION 

 
The power line conducted emission measurements were performed in a Series 81 type shielded enclosure 
manufactured by Rayproof. The EUT was assembled on a wooden table 80 centimeters high. Power was fed to 
the EUT through a 50 ohm /50 microhenry Line Impedance Stabilization Network (EUT LISN). The EUT LISN 
was fed power through an A.C. filter box on the outside of the shielded enclosure. The filter box and EUT LISN 
housing are bonded to the ground plane of the shielded enclosure. A second LISN, the peripheral LISN, 
provides isolation for the EUT test peripherals. This peripheral LISN was also fed A.C. power. A metal power 
outlet box, which is bonded to the ground plane and electrically connected to the peripheral LISN, powers the 
EUT host peripherals. 
 
The spectrum analyzer was connected to the A.C. line through an isolation transformer. The 50-ohm output of 
the EUT LISN was connected to the spectrum analyzer input through a Solar 7 kHz high-pass filter. The filter is 
used to prevent overload of the spectrum analyzer from noise below 7 kHz. Conducted emission levels were 
measured on each current-carrying line with the spectrum analyzer operating in the CISPR quasi-peak mode (or 
average mode if applicable). The analyzer's 6 dB bandwidth was set to 9 kHz. No video filter less than 10 times 
the resolution bandwidth was used.  Average measurements are performed in linear mode using a 10 kHz 
resolution bandwidth, a 1 Hz video bandwidth, and by increasing the sweep time in order to obtain a calibrated 
measurement. The range of the frequency spectrum to be investigated is specified in FCC Part 15. The highest 
emission amplitudes relative to the appropriate limit were measured and have been recorded in this report. 

 
 

Summary of Contents for CompactFlash 5000

Page 1: ...rporation 7 Atir Yeda Street Kfar Saba Israel Phone 972 9 7644908 Device Under Test SanDisk SSD SATA 5000 2 5 Document Number 2007160 Reference Number QRTL07 033 This report may not be reproduced exce...

Page 2: ...g FCC Class B Compliance Standard s to which device was tested STANDARDS SPECIFIC TESTS APPLICABILITY Tested Not Tested CFR47 Parts 15 109 and 15 107 Radiated and Conducted Emissions Test Engineer Jon...

Page 3: ...IGURATION OF TESTED SYSTEM 7 3 PRODUCT LABELLING INFORMATION TO THE USER 8 3 1 DOC LABEL ON DEVICE 8 3 2 DOC STATEMENT IN USER S MANUAL 8 3 3 LOCATION OF LABEL ON EUT 8 4 CONDUCTED EMISSIONS 9 4 1 SIT...

Page 4: ...te 1400 Herndon Va 20170 Complete description and site attenuation measurement data has been placed on file with the Federal Communications Commission The power line conducted emission measurements we...

Page 5: ...sis o Operating shock 1 500G 0 5msec half sine o Operating vibration 2 17G 7 500 Hz o Operating temperature 0 C to 70 C o Non operating temperature and storage 55 C to 95 C o Operating temperature 0 C...

Page 6: ...on RTL Bar Code Equipment Arrival Date Laptop PC Dell Latitude D620 PP18L N A DoC Unshielded Power N A 4 10 2007 Laptop AC Adapter Dell LA65NS0 00 CN 0DF263 71615682 2ED4 N A Unshielded 017737 4 10 20...

Page 7: ...1400 Herndon VA 20170 http www rheintech com SanDisk Corporation Page 7 of 17 DoC Report 2006137 04 27 07 2 5 CONFIGURATION OF TESTED SYSTEM Laptop PC with SanDisk SSD SATA 5000 USB Termination Monito...

Page 8: ...pursuant to part 15 of the FCC Rules These limits are designed to provide reasonable protection against harmful interference in a residential installation This equipment generates uses and can radiate...

Page 9: ...ne and electrically connected to the peripheral LISN powers the EUT host peripherals The spectrum analyzer was connected to the A C line through an isolation transformer The 50 ohm output of the EUT L...

Page 10: ...9 56 0 19 1 46 0 9 1 Pass 15 070 Pk 25 2 2 3 27 5 60 0 32 5 50 0 22 5 Pass 17 640 Pk 28 2 2 5 30 7 60 0 29 3 50 0 19 3 Pass 25 100 Pk 29 4 2 7 32 1 60 0 27 9 50 0 17 9 Pass Phase Conductor Temperatur...

Page 11: ...360 Herndon Parkway Suite 1400 Herndon VA 20170 http www rheintech com SanDisk Corporation Page 11 of 17 DoC Report 2006137 04 27 07 4 3 CONDUCTED TEST PHOTOGRAPHS...

Page 12: ...ency the EUT was rotated 360 and the antenna was raised and lowered from 1 to 4 meters in order to determine the emission s maximum level Measurements were taken using both horizontal and vertical ant...

Page 13: ...orrection Factor SCF used in the above equation is determined empirically and is expressed in the following equation SCF dB m PG dB AF dB m CL dB SCF Site Correction Factor PG Pre amplifier Gain AF An...

Page 14: ...1 0 42 2 19 4 22 8 30 0 7 2 Pass 200 000 Qp V 190 1 0 35 3 19 0 16 3 30 0 13 7 Pass 225 000 Qp V 290 1 0 32 7 18 5 14 2 30 0 15 8 Pass 250 000 Qp H 160 4 0 44 2 15 5 28 7 37 0 8 3 Pass 369 340 Qp H 19...

Page 15: ...360 Herndon Parkway Suite 1400 Herndon VA 20170 http www rheintech com SanDisk Corporation Page 15 of 17 DoC Report 2006137 04 27 07 5 4 RADIATED TEST PHOTOGRAPHS...

Page 16: ...Solar 8130 947306 900729 N A 16A LISN AFJ International LS16 110VAC 16010020080 901083 4 4 2008 16A LISN AFJ International LS16 110VAC 16010020081 901082 1 6 2008 Current Probe Telecom conducted Fisc...

Page 17: ...g the measurement procedure and test equipment that was used contained in the test report iv A description of the equipment under test EUT and support equipment connected to or installed within the EU...

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