GRL-PCIE-TX Quick Start/User Guide/MOI
Rev1.0
© PCI-SIG 2022
Version 1.0, Mar 2022. Updated 03.26.2022
Page.
26
Data/Clock Channel
Select the Scope channels that are connected to the Data Lanes
and Reference Clock of the respective test fixture.
Fixture Type
Select a PCIe compliance test fixture in use.
Data/Clock Channel Auto
Scale
Select “True” to enable autoscaling for connected Data or
Reference Clock channels on the Scope.
Data/Clock Vertical V
Diff
Range (V)
Set the vertical range of the Scope to easily detect a change to the
voltage level when running tests.
Gen4 Apply Embedding
Select
“
True
”
to enable embedding to be performed during tests
for PCIe Gen4.
Gen5 Apply Embedding
Select
“
True
”
to enable embedding to be performed during tests
for PCIe Gen5.
Auto Reset
Select the option to automatically power cycle the controller
during tests.
Switch Matrix
Select “True” to enable using an RF switch in the test setup.
Wait Time After Reset (ms)
If “Auto Reset” has been enabled for the
controller, specify the time
interval in milliseconds to stand by after reset.
Gen4 System/AIC
Embedding File
If “Gen4 Apply Embedding” has been set to “True”, enter the name
of the file to be used for embedding of the PCIe Gen4 system board
or add-in card.
Gen5 System/AIC
Embedding File
If “Gen5 Apply Embedding” has been set to “True”, enter the name
of the file to be used for embedding of the PCIe Gen5 system board
or add-in card.
UI (M)
[Gen1/Gen2/Gen3/Gen4/Ge
n5]
Specify the number of sample points to capture for each data rate.
Sample Rate (Gb/s)
[Gen1/Gen2/Gen3/Gen4/Ge
n5]
Specify the real-time sample rate in Gb/s to capture the required
waveform data.
Gen3/Gen4/Gen5 Signal
Quality Test Preset
Select the preset to be applied for PCIe Gen3, Gen4 or Gen5 signal
quality test.
User Real Edge (Gen5)
Select “True” to use real edge channels for PCIe Gen5 compliance
testing.
SigTest Run Mode
Select the SigTest to run Sequential or Parallel signal quality
testing to ensure waveform compliance.
SigTest Max Thread
Specify the maximum number of threads for each SigTest run.
