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Chapter 1 Introduction 3
Foreword
The LEED Software Data Acquisition and Analysis was developed for OCI Vacuum Micro-
engineering by Dr. Greg Hall.
The
software acquires, saves, and analyzes LEED images. The images are
M ultL EE D
stores as platform independent bitmaps (.bmp files), which can be viewed using other Win-
dows applications. Supported platforms are Windows XP and Windows 7.
MultLE ED
can perform analyses on LEED images such as adding and subtracting im-
ages, enhancing brightness and contrast, line scanning through the image, calculating lattice
distances, calculating IV curves and reliability factor calculations, and acquiring Intensity–
Time (IT) curves.
Summary of Contents for BDL800IR
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