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1
Chapter 1-1
Microscopy Procedures
1
Micr
oscopy
Pr
oced
ures
Bright-field Microscopy
1
Bright-field Microscopy
1.1
System Configuration and Controls
This section explains an example system configuration and the controls required for bright-field microscopy using the
ECLIPSE Ci-S/Ci-L.
Names of components are denoted in the following manner:
[Eyepiece]
.
CLAMP
T
O
RQ
UE
ND4
ND8
OUT
IN
DSC
MODEL ECLIPSE Ci-S
NIKON CORPORATION
TOKYO, JAPAN
100–240V~
0.9A
50/60Hz
MADE IN CHINA
This device complies with Part 15 of the FCC
Rules. Operation is subject to the following two
conditions:
(1) this device may not cause harmful interference,
and (2) this device must accept any interference
received, including interference that may cause
undesired operation.
This Class A digital apparatus complies with
Canadian ICES-003.
Cet appareil numérique de la classe A est
confirme à la norme NMB-003 du Canada.
9 4 0 001
4N75
INSPECTION
EQUIPMENT
70
60
50
40
30
20
10
0
90
80
X knob
Condenser focus knob
Dia-illumination
brightness control knob
Y knob
Grip
Condenser centering
screw
AC inlet
Input voltage label
[Eyepiece]
[Objective]
[Stage]
[Condenser]
[Tube]
[Nosepiece]
[Main body]
(The figure shows
ECLIPSE Ci-S.)
Coarse focus torque
adjustment knob
Optical path switching lever
Aperture diaphragm lever
Power switch
Coarse focus knob
Fine focus knob
Capture button
Moving claw of the
specimen holder
ND filter IN/OUT switch
(equipped with Ci-S only)
Condenser focus knob
Field diaphragm dial
Diopter adjustment ring
Coarse focus clamp ring
Coarse focus knob
Fine focus knob
DSC connector