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Key Features
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High-value instrument grade sampling scope optimized for high speed data analysis.
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External reference clock input
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Single ended and differential electrical inputs supported
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Eye capture, jitter, rise/fall, histogram, mask measurement, pattern capture, S21 Capture &
frequency domain, all in a single instrument.
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Multiple modules can be controlled via fast Ethernet 100Base-T
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The DSO tool can operate in a data acquisition only mode where the data is saved on
multiple acquisitions for post processing.
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Supports high density parallel application with scalable concurrent testing.
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Ultra-compact form factor replaces conventional rack test solutions and solves impractical
physical requirements of testing large lane counts. DSO can mount into the Verigy 93K.
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User friendly GUI enables zooming, markers, X/Y histograms, overlays, pre-emphasis with
simultaneous measurement statistical captures
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Load and analyze data that was previously captured in simulation mode
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Capability to save statistical measurements, data files and configurations
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Color graded display for visualizing jitter and noise distributions
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Standard stress masks selection for LRM pre-cursor, LRM post-cursor, LRM symmetric and
LRM Clean Eye
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Mask user defined, auto-detect mask support
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Percentage of failing points
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Save data and mask
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Load mask file
Scope Measurement Suite
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Mask margin, alternate mask margin rules available
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The mask margin (positive or negative) can be extracted for a defined
number of points that
fail, thus allowing for DUT quality assessment, control and binning
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The number of failed points for a region can be returned as well as the actual points that
failed
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Eye opening, eye height and width, eye amplitude, top, base, hi, lo, peak to peak, max, min
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Rise/ fall time, single edge measurement in pattern capture
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Total edge jitter
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Statistical histogram measurements
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Crossing point, crossing percentage
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Advanced pattern measurements:
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Eye measurements on specific bits of the pattern
