Lattice Semiconductor LatticeSC PCI Express x1, User Manual

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LatticeSC PCI Express x1
Lattice Semiconductor Evaluation Board User’s Guide
Test SMA Connections
General-purpose FPGA pins are available via SMA test connections. These connections are designed to permit
evaluations of several types of FPGA I/O buffers. The use of several termination schemes permits easy interfaces
for the type of buffer.
Table 15. Test SMA Connections for FPGA Pins (see Appendix A, Figure 16)
Hi g h Speed Test Point
DP2
(see Appendix A, Figure 15 and 16)
General-purpose FPGA pins are available via a differential test pad. These connections allow a high-impedance
probe to measure the performance of a coupled-differential output buffer pair.
Table 16. Differential I/O Test Point
Lo g ic Analysis Connection
LA1
(see Appendix A, Figure 15 and 16)
Agilent single-ended probes designed for connection to the supplies Tyco/AMP’s 2-767004-2 MICTOR connector
can be easily attached for signal bus analysis. Connections to general-purpose I/O pins are provided to the board
ready 3
8 -pin MICTOR connector.
SMA
Desi g nation Name
SCM25
Si g nal
900-Ball
fpBGA
Termination
Description
Termination
Resistor(s)
J37 LVDS_I N P PR52A AB2 8 N one —
J39 LVDS_I NN PR52B AC2 8 N one —
J3 8 LVDS_OUTP0 PR35A M29
100-ohm
Differential
R275
J40 LVDS_OUT N 0 PR35B N 30
100-ohm
Differential
R275
Probe
True
Probe
Compliment
100-ohm
Differential Resistor
AF30 AG30 R274
Table 17. Logic Analyzer Connections
MICTOR Pin Si g nal 900-Ball fpBGA MICTOR Pin Si g nal 900-Ball fpBGA
5 LA_CLK1 AJ1 6 LA_CLK2 AF4
7 LA_0 AG3 8 LA_16 AH13
9 LA_1 AH2 10 LA_17 AK 8
11 LA_2 AD 8 12 LA_1 8 AK9
13 LA_3 AF7 14 LA_19 AH14
15 LA_4 AJ7 16 LA_20 AG14
17 LA_5 AJ 8 1 8 LA_21 AK10
19 LA_6 AH10 20 LA_22 AK11
21 LA_7 AH11 22 LA_23 AH15
23 LA_ 8 AF13 24 LA_24 AG15
25 LA_9 AE14 26 LA_25 AH12