Pulsed measurements
PNA/PNA-X Series Option 021 port-one internal modulator and 025 internal pulse
generators add pulsed-RF for pulsed antenna test applications. Combined with Option
008, these gates augment the PNA/PNA-X’s pulse measurement capability by enabling
point-in-pulse testing, with pulse widths smaller than 33 ns.
Security
For secure environments, the PNA family features a removable hard drive to completely
ensure the security of the data that is acquired by the PNA. Refer to “Appendix 1” on
page 71 for detailed information.
The following sections demonstrate how the PNA can be integrated into your near-field,
far-field, RCS, and millimeter-wave systems.
Near-field antenna measurements
In near-field applications, the probe is located very close to the antenna under test
(AUT), so sensitivity and dynamic range are not as important a performance consider-
ation as in a far-field antenna range. The user selectable bandwidth feature can be used
to optimize the measurement speed vs. sensitivity tradeoff. By selecting the widest
bandwidth available (5 MHz for DSP-4, 15 MHz for DSP-5), the measurement speed
is maximized. The PNA-X analyzer is mixer based, with fundamental mixing to 26.5
GHz, providing a 24 dB increase in sensitivity and dynamic range over sampler based
analyzers. This more than makes up for the sensitivity reduction realized when the IF
bandwidth of the PNA-X is opened up to its maximum to maximize measurement speed.
Therefore, the PNA-X can achieve faster data acquisition speeds with increased sensi-
tivity in near-field applications over legacy configurations. See Figure 2.
Figure 2. Typical near-field antenna measurement configuration using a PNA/PNA-X.
In addition, PNA-L with direct receiver access can be used.
Pin
switch
Pin switch
control
LAN
06 | Keysight | Antenna Test – Selection Guide