In this section:
Introduction ............................................................................... 5-1
Equipment required .................................................................. 5-1
Set up remote communications ................................................ 5-1
Device connections .................................................................. 5-2
Low-resistance measurements ................................................. 5-5
Introduction
This application example demonstrates how to use the Model 2460 to measure a low-resistance
device.
You may need to make low-resistance measurements (<10
Ω
) in a number of applications. Typical
applications include continuity testing of cables and connectors, substrate vias, and resistors.
Typically, you make these resistance measurements by forcing a current and measuring the resulting
voltage drop. The Model 2460 automatically calculates the resistance. The measured voltage is
usually in the mV range or less. Built-in features of the Model 2460 optimize low-resistance
measurements, such as remote sensing and offset compensation.
Equipment required
•
One Model 2460 Interactive SourceMeter
®
instrument
•
For front-panel connections, use four insulated banana cables such as the Keithley Instruments
Model 8608 High-Performance Clip Lead Set (one set included with the Model 2460; you will
need another set)
•
For rear-panel connections, use one Model 2460-KIT Screw-Terminal Connector Kit (provided
with the Model 2460), or you can use one set of Model 2460-BAN Banana Test Leads/Adapter
Cables (with appropriate connections to the device)
•
One low-resistance device to be tested; the application shown here uses a 20 m
Ω
resistor
Set up remote communications
You can run this application from the front panel or any of the supported communication interfaces for
the instrument (GPIB, USB, or ethernet).
The following figure shows the rear-panel connection locations for the remote communication
interfaces. For additional information about setting up remote communications, see
(on page 3-1).
Section 5
Measuring low-resistance devices