Section 3: Test subroutine library reference
S530 Parametric Test System Test Subroutine Library User's Manual
3-16
S530-907-01 Rev. A / September 2015
Source-measure units (SMUs)
SMU1: Forces I
CES
, programmed voltage limit, measures
bvces
Example
resu1t = bvces(e, b, c, sub, ipgm, vlim, type);
Schematic
bvces1
This subroutine measure the collector-emitter breakdown voltage using the
bsweepV
LPTLib function.
Usage
double bvces1(int
e
, int
b
, int
c
, int
sub
, double
vcemin
, double
vcemax
, int
nstep
, double
ipgm
, double
udelay
, char
type
);
e
Input
The emitter pin of the device
b
Input
The base pin of the device
c
Input
The collector pin of the device
sub
Input
The substrate pin of the device
vcemin
Input
The starting collector-emitter voltage (V
CE
), in volts
vcemax
Input
The ending V
CE
, in volts
nstep
Input
The number of voltage steps
ipgm
Input
The targeted collector-emitter current (I
CE
), in amperes
udelay
Input
The delay between V
CE
steps, in seconds
type
Input
Type of transistor:
"N"
or
"P"
Returns
Output
Collector-emitter voltage:
-1.0
= TYPE not "N" or "P"
+1.0E + 21
= Device triggered on
vcemin
+2.0E + 21
= Device triggered on
vcemax
