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4-10
4.4.2 Transistor testing
A matrix system for testing DC parameters of transis-
tors is shown in Figure 4-7. This system uses two
Source Measure Units (SMU). There are three SMUs
available from Keithley; the Model 236 Source Measure
Unit, Model 237 High Voltage Source Measure Unit
and Model 238 High Current Source Measure Unit.
Keep in mind that if using the Models 237 (high voltage
capability) or 238 (high current capability), do not ex-
ceed the maximum signal levels of the matrix card.
Maximum allowable DC signals are 110V and 1A, 30W
with resistive load.
This system tests three transistors, but can be expand-
ed to test more by simply using additional Model 7012
matrix cards. The Model 7001 will accommodate two
matrix cards. Daisy-chaining six Model 7001s expands
the system to 12 matrix cards allowing 36 or more tran-
sistors to be tested.
NOTE
The Model 7012 is a general purpose
matrix card and cannot be used to
check FETs or transistors that have
high gain or low power. To test these
devices, a matrix card with low offset
current and high isolation characteris-
tics must be used.
Figure 4-7
Transistor testing
Output HI
Sense HI
Sense LO
Output LO
SMU #1
Output HI
Sense HI
Sense LO
Output LO
SMU #2
H
L
H
L
H
L
7012
Rows
1
2
3
4
1
2
3
H
L
H
L
H
L
4
5
6
H
L
H
L
H
L
7
8
9
H
L
10
H
L
H
L
H
L
H
L
Columns
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