Keithley 4200-SCS, User Manual

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4200-900-01 Rev. K / February 2017 Index-1
Index Model 4200-SCS User’s Manual
Symbols
“connect” parameters for “4terminal-n-fet” device .....
4-15
“cvsweep” UTM .................................................. 4-43
“probesubsites” test descriptions ........................ 4-23
Numerics
4- terminal n-MOSFET tests ................................. 3-5
4200-SCS Hardware Overview .......................... 1-10
59283
Heading Level 3
Average equivalent time points .......... 1-31
72968
Heading Level 4
2.4.1.5 Project Plan ............................ 2-22
A
Acquisition sample rate ...................................... 1-30
Add a Device Plan .............................................. 4-41
Add a new Device Plan to a KITE project .......... 4-41
Add a new Subsite Plan ..................................... 4-41
Add a new Subsite Plan to a KITE project ......... 4-40
Add a switch card to the system configuration ... 4-10
Add a switch matrix to the system configuration .. 4-9
Add a test fixture to the system configuration ...... 4-9
Add the “cvsweep” UTM ..................................... 4-42
Adding a Keithley 590 CV Analyzer to the system
configuration ............................................... 4-38
Adding a probe station .............................4-20
,
4-30
Adding a pulse generator ................................... 4-29
Adding a switch matrix .............................4-19
,
4-29
Advanced Connections ...................................... 1-37
B
Basic
ground unit characteristics ......................... 1-32
SMU source-measure configuration ........... 1-11
SMU/PreAmp source-measure configuration ....
1-14
Basic test execution ........................................... 2-21
Boot the system and log in ................................. 1-38
Buttons to close or reduce size of test documents ....
4-35
C
Calculate functions ............................................. 1-31
Changing KITE startup behavior ........................ 3-12
Chassis ground .................................................. 1-35
Clear Append Data method for deleting Append
worksheets ................................................. 2-38
Compensation .................................................... 3-20
Configuration
ITMs ........................................................... 2-17
Configuring the switch matrix ...................4-19
,
4-30
Connect SMUs to N-channel MOSFET .............. 4-24
Connect SMUs to NPN transistor ....................... 4-24
connect test ........................................................ 4-14
Connecting Devices Under Test (DUTs) ............ 1-36
Connecting the switch matrix ................... 4-20
,
4-31
Connections ......................................................... 3-9
Contents of the Keithley Device file new-mosfet.kdv .
2-28
Controlling a CV Analyzer .................................. 4-37
Add a Device Plan ..................................... 4-41
Add a Subsite Plan .................................... 4-40
Add a UTM ................................................. 4-42
Connections ............................................... 4-38
Create a new project .................................. 4-39
KCON setup ............................................... 4-38
Modifying the “cvsweep” UTM ................... 4-43
Controlling a probe station
KCON setup ............................................... 4-19
Open the “probesubsites” project .............. 4-21
Open the project plan window ................... 4-22
Probe station configuration ........................ 4-21
Prober control overview ............................. 4-16
Running the test sequence ........................ 4-25
Test data .................................................... 4-26
Test descriptions ........................................ 4-22
Test system connections ........................... 4-18
Controlling a pulse generator
Compare the test results ............................ 4-35
Overlaying graphs .............................. 4-36
Description of tests .................................... 4-32
“pgu1-init” test .................................... 4-33
“pgu1-setup” test ................................ 4-34
“pgu-trigger” test ................................ 4-34
First “connect” test ............................. 4-32
First “id-vg” test .................................. 4-32
Second “connect” test ........................ 4-33
Second “id-vg” test ............................. 4-34
Third “connect” test ............................ 4-34
KCON setup ............................................... 4-28
Open the “ivpgswitch” project .................... 4-31
Running the test sequence ........................ 4-35
Test system connections ........................... 4-28
Controlling a switch matrix
“connect” test description ........................... 4-14
Running test sequences ............................ 4-12
Controlling external equipment overview ............. 4-2
Copying entire KITE project ............................... 3-10
Copying individual tests using the test library manager
.................................................................... 3-11
CVU Frequency Sweep (bias) ........................... 3-24
CVU Frequency Sweep (step) ........................... 3-26
CVU Voltage Bias .............................................. 3-21
CVU Voltage List Sweep .................................... 3-23
CVU Voltage Sweep .......................................... 3-22
D
Data Save As window ........................................ 2-36
Data worksheet of a Sheet tab containing both data
and Formulator results ............................... 2-33
Data worksheet of a Sheet tab containing data for
multiple sweeps ......................................... 2-33
Data-source identifier ......................................... 2-35
DC Preamp ........................................................ 1-14
Index