Keithley 4200-SCS, User Manual

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4-32 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 4: How to Control Other Instruments with the Model 4200-SCS Model 4200-SCS User Manual
Description of tests
First connect test
The first test, connect, is a UTM that connects the device to the four SMUs. In the project
navigator, double-click the first
connect UTM to open it. Figure 4-47 shows the parameters that
connect the device to the SMUs.
NOTE The first parameter (line 1 ) opens any relays that may have been closed by a previous
test.
For the other parameter shown in Figure 4-47 , the device connects to the SMUs as shown in
Figure 4-48 . For details about the connect UTM, refer to the Reference Manual, Appendix A,
Creating Project Prompts .
Figure 4-47
First connect test: Connects the device to the SMUs
Figure 4-48
Signal paths for the pre- and post-stress tests
First id-vg test
The
id-vg
ITM measures the transfer characteristics of the N-channel MOSFET. The I
D
vs. V
G
data points are graphed. The test also calculates and graphs transconductance. This is the
before-stress
characterization test.
Connects SMU1 to pin 3 of test fixture
Connects SMU2 to pin 4 of test fixture
Connects SMU3 to pin 5 of test fixture
Connects SMU4 to pin 6 of test fixture
Opens all relays
Gate
Source
D rain
Substrate
N-C h annel
MOS F E T
S M U 1
S M U2
S M U3
1 2 3 4 5 6
A
B
C
D
E
F
GN D
S M U 4
PGU
L O