Section 6: Characterization of power discretes
Model 2651A High Power System SourceMeter® Instrument User's Manual
To avoid device self-heating, this test is usually performed using pulsed measurements. This method
pulses voltage across the device for a short duration. During this pulse, after the pulse has settled,
the current is measured. The duration of the pulse and the duty cycle in which the pulses are applied
to the device are controlled, minimizing self-heating. A single Model 2651A High Power System
SourceMeter
®
Instrument can pulse-measurement test with precision timing at currents up to 50 A
and pulse widths as low as 100 µs.
This example demonstrates how to perform pulsed measurements and collect I-V curves using the
Model 2651A High Power System SourceMeter
®
Instrument on a MOSFET. The same procedure
could be used to test IGBTs.
Equipment needed for this example
To run this test, you will need the following equipment:
•
Model 2651A High Power System SourceMeter
®
Instrument
•
Series 2600A System SourceMeter
®
Instrument (see NOTE)
•
TSP-Link
®
cable (Keithley Instruments part number CA-180-3A)
•
GPIB cable or Ethernet cable to connect the Model 2651A to a computer
•
Additional cable and connector assemblies as required to make connections to the device under
test (DUT) (for example, Model 2651A-KIT and Model 2600-KIT); see
(on
page 6-4) for a schematic of required connections
NOTE
For this application, Series 2600A System SourceMeter
®
Instrument refers to any of the following
instrument models: Models 2601A/2602A, 2611A/2612A, or 2635A/2636A.
Set up communication
The communication setup is illustrated in the following diagram. GPIB is used as an example, but this
application can be run using any of the supported communication interfaces for the instruments. A
TSP-Link
®
connection enables communication between the two instruments. Commands for the
Series 2600A (on TSP-Link node 2) are sent over the TSP-Link interface.
6-2
2651A-900-01 Rev. A / March 2011
